• The KIPS Transactions:PartD
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• v.13D no.2 s.105
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• pp.165-174
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• 2006

As new database systems are developed or new functions are added to existing database systems, database developers or users would like to evaluate new database systems or new functions. This paper presents an integrated database benchmark suite. The integrated suite offers genetic benchmarks, custom benchmark, and hybrid benchmarks to users on a unified Web user interface. With regard to text data generation, the integrated suite supports eight data distributions with three data types. The integrated suite can also generate XML data in three different ways. Users can run benchmarks in realistic environments by performing the workload generation facility of the integrated suite, which generates composite workloads similar to real-world workloads. Using supporting tools, users can easily implement new generic and custom benchmarks in the integrated suite. An illustrative demonstration to add a new custom benchmark into the integrated suite is presented.

• ETRI Journal
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• v.23 no.3
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• pp.138-149
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• 2001

Due to the rapidly growing complexity of VLSI circuits, test methodologies based on delay testing become popular. However, most approaches cannot handle custom logic blocks which are described by logic functions rather than by circuit primitive elements. To overcome this problem, a new path delay test generation algorithm is developed for custom designs. The results using benchmark circuits and real designs prove the efficiency of the new algorithm. The new test generation algorithm can be applied to designs employing intellectual property (IP) circuits whose implementation details are either unknown or unavailable.

• IEMEK Journal of Embedded Systems and Applications
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• v.11 no.2
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• pp.97-105
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• 2016

Microcontrollers (MCUs) for endpoint smart sensor devices of internet-of-thing (IoT) are being implemented as system-on-chip (SoC) with on-chip instruction flash memory, in which user firmware is embedded. MCUs directly fetch binary code-based instructions through bit-line sense amplifier (S/A) integrated with on-chip flash memory. The S/A compares bit cell current with reference current to identify which data are programmed. The S/A in reading '0' (erased) cell data consumes a large sink current, which is greater than off-current for '1' (programmed) cell data. The main motivation of our approach is to reduce the number of accesses of erased cells by binary code level transformation. This paper proposes a built-in write/read path architecture using binary code inversion method based on hot-spot region detection of instruction code access to reduce sensing current in S/A. From the profiling result of instruction access patterns, hot-spot region of an original compiled binary code is conditionally inverted with the proposed bit-inversion techniques. The de-inversion hardware only consumes small logic current instead of analog sink current in S/A and it is integrated with the conventional S/A to restore original binary instructions. The proposed techniques are applied to the fully-custom designed MCU with ARM Cortex-M0$^{TM}$ using 0.18um Magnachip Flash-embedded CMOS process and the benefits in terms of power consumption reduction are evaluated for Dhrystone$^{TM}$ benchmark. The profiling environment of instruction code executions is implemented by extending commercial ARM KEIL$^{TM}$ MDK (MCU Development Kit) with our custom-designed access analyzer.

• The Transactions of the Korea Information Processing Society
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• v.4 no.8
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• pp.2120-2132
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• 1997

A layout automation system for analog integrated circuits is proposed. The implemented system performs full-custom analog layout under the analog layout constraints. In order to overcome the demerits of conventional analog layout systems, parameterized module library is proposed. The system can support complex analog layout modules, resulting in a maximum expandability of the system. Moreover, modified dynamic multi-path algorithm is developed by enhancing the conventional Dijkstra algorithm. Several benchmark circuits such as comparator, op amp, and filter was tested by the system. Layout results compared to OPASYN show well-merging layout and interdigitized layout module.