• Journal of information and communication convergence engineering
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• 제3권1호
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• pp.28-32
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• 2005

In this paper, we propose a novel test method to effectively detect hard and soft faults in CMOS 2-stage op-amps. The proposed method uses a very high frequency sinusoidal signal that exceeds unit gain bandwidth to maximize the fault effects. Since the proposed test method doesn't require any complex algorithms to generate the test pattern and uses only a single test pattern to detect all target faults, therefore test costs can be much reduced. The area overhead is also very small because the CUT is converted to a unit gain amplifier. Using HSPICE simulation, the results indicated a high degree of fault coverage for hard and soft faults in CMOS 2-stage op-amps. To verify this proposed method, we fabricated a CMOS op-amp that contained various short and open faults through the Hyundai 0.65-um 2-poly 2-metal CMOS process. Experimental results for the fabricated chip have shown that the proposed test method can effectively detect hard and soft faults in CMOS op-amps.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 1998년도 하계종합학술대회논문집
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• pp.819-822
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• 1998

The high complexity of digital circuits has changed the digital circuits design mehtods from schemeatic-based to hardware description languages like VHDL, verilog that make hardware faults become more hard to detect. Thus test generation to detect hardware defects is very important part of the design. But most of the test generation methods are gate-level based. In this paper new high-level test generation method to detect stuck-at-faults on gate level is described. This test generation method is independent of synthesis results and reduce the time and efforts for test generation.

• 대한임베디드공학회논문지
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• 제4권1호
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• pp.23-28
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• 2009

Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described.

• 한국정보통신학회논문지
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• 제16권2호
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• pp.313-318
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• 2012

본 논문에서는 $30{\mu}m$ 이하의 초 미세 피치를 가진 칩 온 필름(chip-on-film, COF)에서 자주 발생하는 결함을 자동으로 검출할 수 있는 시스템을 제안한다. 개발된 시스템은 초 미세 패턴의 개방 및 단락 결함 뿐만아니라 소프트 개방 및 소프트 단락을 신속히 검출할 수 있는 회로 및 기술이 적용되어 있다. 결함 검출의 기본 원리는 결함 전의 패턴 저항값과 결함 후의 패턴 저항값 차에 의해 발생하는 미세 차동 전압을 읽어서 결함 유무를 판단한다. 또한 미세전압 차를 증폭시켜 결함 유무를 쉽게 판단할 수 있도록 고주파 공진기를 이용한다. 제안된 시스템은 초미세 패턴 COF 검사 과정에서 발생하는 다양한 결함을 신속하고 정확히 검출할 수 있으므로 기존의 COF 검사 시스템의 대안이 될 것으로 기대한다.

• 대한전자공학회논문지SD
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• 제37권12호
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• pp.50-59
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• 2000

본 논문에서는 고집적 SRAM의 다양한 고장을 검출하기 위하여 동적 전원 공급 전류를 관찰하는 방법을 이용하였다. 다양한 고장을 가정하여 고장이 없는 경우와 고장이 발생한 경우 transition write시의 Iddt 펄스의 크기가 크게 다른 것을 이용하여 쓰기 동작만으로 구성된 메모리 테스트 알고리듬을 개발하였다. 새로운 알고리듬은 기존의 March B 알고리듬에 비해서 7/17의 짧은 길이를 가지고도 더 많은 잠재적인 고장을 검출할 수 있다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1998년도 추계학술대회 논문집 학회본부 B
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• pp.600-602
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• 1998

In this paper, we implement BIST to efficiently test circuits with pipeline architecture and JTAG to control implemented BIST and support board level test. Since implemented BIST is designed to be initialized using new seed, hard-to-detect faults are easily detected. Besides, to optimize area overhead, it uses JTAG instead of BIST controller and modified pipeline register instead of added test pattern generator and signature generator. And, to optimize pin overhead, it uses pins of JTAG. Function and efficiency of implemented BIST is verified by simulation.

• 한국군사과학기술학회지
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• 제20권5호
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• pp.688-699
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• 2017

Model-based test, a well-known method of the black box tests, is consisted of the following four steps : model construction using requirement, test case generation from the model, execution of a SUT (software under test) and detection failures. Among models constructed in the first step, state-based models such as UML standard State Machine are commonly used to design event-based embedded systems (e.g., weapon control systems). To generate test cases from state-based models in the next step, coverage-based techniques such as state coverage and transition coverage are used. Round-trip path coverage technique using W-Method, one of coverage-based techniques, is known as more effective method than others. However it has a limitation of low failure observability because the W-Method technique terminates a testing process when arrivals meet states already visited and it is hard to decide the current state is completely same or not with the previous in the case like the GUI environment. In other words, there can exist unrevealed faults. Therefore, this study suggests a Extended W-Method. The Extended W-Method extends the round-trip path to a final state to improve failure observability. In this paper, we compare effectiveness and efficiency with requirement-item-based technique, W-Method and our Extended W-Method. The result shows that our technique can detect five and two more faults respectively and has the performance of 28 % and 42 % higher failure detection probability than the requirement-item-based and W-Method techniques, respectively.

• 대한임베디드공학회논문지
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• 제12권1호
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• pp.43-62
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• 2017

Mobile pulse scanning Light Detection And Ranging (LIDAR) are essential components of intelligent vehicles capable of autonomous travel. Obstacle detection functions of autonomous vehicles require very low failure rates. With the increasing number of autonomous vehicles equipped with scanning LIDARs to detect and avoid obstacles and navigate safely through the environment, the probability of mutual interference becomes an important issue. The reception of foreign laser pulses can lead to problems such as ghost targets or a reduced signal-to-noise ratio. This paper will show the probability that any two scanning LIDARs will interfere mutually by considering spatial and temporal overlaps. We have conducted four experiments to investigate the occurrence of the mutual interference between scanning LIDARs. These four experimental results introduced the effects of mutual interference and indicated that the interference has spatial and temporal locality. It is hard to ignore consecutive mutual interference on the same line or the same angle because it is possible the real object not noise or error. It may make serious faults because the obstacle detection functions of autonomous vehicle rely on heavily the scanning LIDAR.

• 한국소음진동공학회논문집
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• 제26권6_spc호
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• pp.714-720
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• 2016

Rubbing and misalignment are the most usual faults that occurs in rotating machinery and with them severe effect on power plant availability. Especially blade rubbing is hard to detect on FFT spectrum using the vibration signal. In this paper, the possibility of feature analysis of vibration signal is confirmed under blade rubbing and misalignment condition. And the lab-scale rotor test device provides the blade rubbing and shaft misalignment modes. Feature selection based on GA (genetic algorithm) is processed by the extracted feature of the time domain. Then, classification of the features is analyzed by using SVM (support vector machine) which is one of the machine learning algorithm. The results of features selection based on GA compared with those based on PCA (principal component analysis). According to the results, the possibility of feature analysis is confirmed. Therefore, blade rubbing and shaft misalignment can be diagnosed by feature of vibration signal.

• 대한전자공학회논문지SD
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• 제38권1호
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• pp.44-54
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• 2001

본 논문에서는 아날로그 회로에 존재하는 강고장(hard fault)과 약고장(soft fault)을 검출하기 위한 새로운 테스트 방식을 제안한다. 제안한 테스트 방식은 연산 증폭기의 특성중 하나인 오프셋 전압(offset voltage)을 이용한다. 테스트 시, 테스트 대상 회로(CUT: Circuit Under Test)는 귀환 루프를 가지는 단일 이득 연산 증폭기로 변환된다. 연산 증폭기의 입력이 접지되었을 때, 정상 회로는 작은 오프셋 전압을 가지지만 고장이 존재하는 회로는 큰 오프셋 전압을 가진다. 따라서 오프셋 전압의 허용 오차를 벗어나는 연산증폭기 내에 존재하는 고장들을 검출할 수 있다. 제안한 테스트 방식은 테스트 패턴 없이 단지 입력을 접지시키면 되므로 테스트 패턴을 생성하는 문제를 제거시킬 수 있어 테스트 시간과 비용이 감소한다. HSPICE 모의 실험을 통하여 본 논문에서 제안하는 방식을 단일 연산증폭기와 듀얼 슬롭(dual slope) A／D 변환기에 적용한 결과 높은 고장 검출율(fault coverage)을 얻었다.