• Journal of the Korean Crystal Growth and Crystal Technology
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• v.19 no.2
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• pp.102-105
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• 2009

The accelerated life time test of the MLCCs with different $BaTiO_3$ particle sizes were conducted at $150^{\circ}C$, 75 V condition and the effect of $BaTiO_3$ particle size on the breakdown voltage and degradation characteristics of MLCCs was investigated. The MLCCs were prepared by using the $BaTiO_3$ particles having the size of $0.525{\mu}m$, $0.555{\mu}m$, $0.580{\mu}m$ and Ni-electrode, respectively. The MLCCs which have the particle size of $0.525{\mu}m$, $0.555{\mu}m$, and $0.580{\mu}m$, respectively were confirmed to meet the standard requirements of X5R(change capacitance within ${\pm}15%$ at $-55{\sim}85^{\circ}C$) by TCC(Temperature Coefficient of Capacitance). The effect of the $BaTiO_3$ particle size on the insulation resistance behavior of MLCCs was confirmed by BDV(Breakdown Voltage) measurements and the cause and degree of degradation of MLCCs were characterized by XPS analysis after the accelerated life test. The MLCCs with $0.525{\mu}m-BaTiO_3$ showed better insulation resistance and BDV characteristics compare to other MLCCs and XPS analysis revealed that the MLCCs degradation is caused by the NiO peak and $BaTiO_3$ peak decrease.

• Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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• 2014.04a
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• pp.392-393
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• 2014

Multilayer ceramic capacitors (MLCCs) have become one kind of the most widely used electrical components in recent decades. And the technology of MLCCs is developing continuously towards a direction of high capacitance and miniaturization. While the tiny thickness and the large quantity of the layers often make it very troublesome to do analysis with the full model MLCCs. In order to solve this problem, reduced model with fewer layers of MLCC was designed and verified in this paper.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.29 no.3
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• pp.152-158
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• 2016

The bonding characteristics of MLCCs (multi layer ceramic capacitor, C1608) lead-free solder (SAC305) joints were evaluated through thermal shock test ($-40^{\circ}C{\sim}125^{\circ}C$, total 1,800 cycle). After the test, IMCs( intermetallic compounds) growth and cracks were verified, also shear strengths were measured for degradation of solder joints. In addition, The thermal stress distributions at solder joints were analyzed to compare the solder joints changes before and after according to thermal shock test by FEA (finite elements analysis). We considered the effects of IMCs growth at solder joints. As results, the bonding characteristics degradation was occurred according to initial crack, crack propagations and thermal stress concentration at solder-IMCs interface, when the IMCs grown to solder inside.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.18 no.8
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• pp.685-689
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• 2005

In the fabrication and design of MLCCs (Multilayer Ceramic Capacitors) with Ni inner electrode for medium and high voltage, reliability and dielectric breakdown mode have been investigated. For thickness of green sheet, the relationship between the rated voltage versus the thickness of green sheet. Increasing the thickness of green sheet increases the dielectric breakdown voltage. However, a practical limit to this linear relationship occurs at 30 urn and above. As the thickness of green sheet increased, dielectric breakdown voltage and weibull coefficient is increased, but abruptly decrease at 30 urn and 36 urn. When 24 urn of green sheet thickness, weibull coefficient and dielectric breakdown voltage were 13.58 and 70 V/um respectively. The results enabling the MLCCs to demonstrate high levels of reliability at medium and high voltage.

• Journal of the Microelectronics and Packaging Society
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• v.20 no.3
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• pp.7-10
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• 2013

This study presents an approach to predict insulation resistance failure of multilayer ceramic capacitors (MLCCs) using non-linear modeling. A capacitance aging model created by non-linear modeling allowed for the prediction of insulation resistance failure. The MLCC data tested under temperature-humidity-bias testing conditions showed that a change in capacitance, when measured against a capacitance aging model, was able to provide a prediction of insulation resistance failure.

• Journal of the Korean Ceramic Society
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• v.46 no.2
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• pp.175-180
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• 2009

Multilayer ceramic capacitors (MLCCs) have continually been made smaller in size and larger in capacity in resent years. However, the end termination electrode is still thick in many MLCCs. In this study, we used small grain glass frit to embody thin film and highly densification in the end termination by improve sintering driving force with well-dispersion and rising surface energy. Pastes were fabricated using size changed glass frit, such as 0.1 ${\mu}m$, 0.5 ${\mu}m$, 1.0 ${\mu}m$, 4.0 ${\mu}m$. Fabricated pastes were applied 05A475KQ5 chip and fired various sintering temperatures to analyze sintering behavior of pastes. Consequently, small glass frit used pastes have many merits than larger, such as well-dispersion, improve cornercoverage and surface roughness, possibility of low temperature sintering. However, we confirmed that small glass frit used pastes have narrow sintering window by rapid completion of sintering densification.

• Journal of the Microelectronics and Packaging Society
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• v.27 no.4
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• pp.97-105
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• 2020

Recently, as the data speed and operating frequencies of Ethernet keeps increasing, electro magnetic interference (EMI) also becomes increasing. The generation of such EMI will cause malfunction of near electronic devices. In this study, EMI filters were applied to reduce the EMI generated by DC-DC SMPS (switching mode power supply), which is the main cause of EMI generation of Ethernet switch. As the EMI filter, MLCCs with excellent withstanding voltage characteristics were used, which had advantages in miniaturization and mass production. Two types of EMI MLCC filters were used, which are X-capacitor and X, Y-capacitor. X-capacitor was composed of 2 MLCCs with 10 nF and 100 nF capacity and 1 Mylar capacitor. Y-capacitor was consisted of 6 MLCCs with a capacity of 27 nF. When only X-capacitor was applied as EMI filter, the conductive EMI field strength exceeded the allowable limit in frequency range of 150 kHz ~ 30 MHz. The radiative EMI also showed high EMI strength and very small allowable margin at the specific frequencies. When the X and Y-capacitors were applied, the conductive EMI was greatly reduced, and the radiation EMI was also found to have sufficient margin. In addition, X, Y-capacitors showed very high insulation resistance and withstanding resistance performances. In conclusion, EMI X, Y-capacitors using MLCCs reduced the EMI noise effectively and showed excellent electrical reliability.

• Proceedings of the Korean Ceranic Society Conference
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• 2003.04a
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• pp.87.1-87
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• 2003

• Proceedings of the Korean Ceranic Society Conference
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• 2002.10a
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• pp.68.2-68
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• 2002

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.21 no.12
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• pp.1118-1123
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• 2008

High voltage multilayer ceramic capacitors (MLCCs) are classified into two classes-those for temperature compensation (class I) and high dielectric constant materials (class II). We manufactured high voltage MLCC with temperature coefficient characteristics of C0G and X7R and studied the characteristics of electric properties. Also we studied the characteristics of dielectric breakdown voltage (V) as the variation of thickness in the green sheet and how to pattern the internal electrodes. The dielectric breakdown by electric field was caused by defects in the dielectric materials and dielectric/electrode interface, so the dielectric thickness increased, the withstanding voltage per unit (E) thickness decreased. To overcome this problem, we selected the special design like as floating electrode and this design affected the increasing breakdown voltage(V) and realized the constant withstanding voltage per unit thickness(E). From these results, high voltage application of MLCCs can be expanded and the rated voltage can also be develop.