• The Transactions of The Korean Institute of Electrical Engineers
• /
• v.56 no.5
• /
• pp.980-986
• /
• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• Journal of Institute of Control, Robotics and Systems
• /
• v.14 no.7
• /
• pp.624-628
• /
• 2008

This paper is concerned with multiple motor control using a distributed network control method. Speed and position of multiple motors are synchronized using clock synchronized distributed controllers. CAN (controller area network) is used and a new clock synchronization algorithm is proposed and implemented. To verify the proposed control algorithm, two disks which are attached on two motor shafts are controlled to rotate at the same speed and phase angle with the same time base using network clocks.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.43 no.1 s.343
• /
• pp.37-44
• /
• 2006

This paper proposes an interconnect delay fault test (IDFT) solution on boards and SoCs based on IEEE 1149.1 and IEEE P1500. A new IDFT system clock rising edge generator which forces output boundary scan cells to update test data at the rising edge of system clock and input boundary scan cells to capture the test data at the next rising edge of the system clock is introduced. Using this proposed circuit, IDFT for interconnects synchronized to different system clocks in frequency can be achieved efficiently. Moreover, the proposed IDFT technique does not require any modification of the boundary scan cells or the standard TAP controller is simple in terms of test procedure and is small in terms of area overhead.

• ETRI Journal
• /
• v.28 no.4
• /
• pp.475-485
• /
• 2006

Network-on-chip (NoC) is an emerging design paradigm intended to cope with future systems-on-chips (SoCs) containing numerous built-in cores. Since NoCs have some outstanding features regarding design complexity, timing, scalability, power dissipation and so on, widespread interest in this novel paradigm is likely to grow. The test strategy is a significant factor in the practicality and feasibility of NoC-based SoCs. Among the existing test issues for NoC-based SoCs, test access mechanism architecture and test scheduling particularly dominate the overall test performance. In this paper, we propose an efficient NoC-based SoC test scheduling algorithm based on a rectangle packing approach used for current SoC tests. In order to adopt the rectangle packing solution, we designed specific methods and configurations for testing NoC-based SoCs, such as test packet routing, test pattern generation, and absorption. Furthermore, we extended and improved the proposed algorithm using multiple test clocks. Experimental results using some ITC'02 benchmark circuits show that the proposed algorithm can reduce the overall test time by up to 55%, and 20% on average compared with previous works. In addition, the computation time of the algorithm is less than one second in most cases. Consequently, we expect the proposed scheduling algorithm to be a promising and competitive method for testing NoC-based SoCs.

• Journal of information and communication convergence engineering
• /
• v.3 no.3
• /
• pp.142-145
• /
• 2005

In this paper, a new programmable DLL (delay locked loop) based clock synthesizer is proposed. DLL has several inherent advantages, such as no phase accumulation error, fast locking and easy integration of the loop filter. This paper proposes a new programmable DLL that includes a PFD(phase frequency detector), a LSI(lock status indicator), and a VCDL(voltage controlled delay line) to generate multiple clocks. It can generate clocks from 3 to 9 times of input clock with $2{\mu}s$ locking time. The proposed DLL operating in the frequency range of 300MHZ-900MHz is verified by the HSPICE simulation with a $0.35{\mu}m$ CMOS process.

• Proceedings of the KIEE Conference
• /
• 2007.07a
• /
• pp.1840-1841
• /
• 2007

To the Boundary Scan, this architecture in Scan testing of design under the control of boundary scan is used in boundary scan design to support the internal scan chain. The internal scan chain has single scan-in port and single scan-out port that multiple scan chain cannot be used. Internal scan design has multiple scan chains, those chains must be stitched to form a scan chain as this paper. We propose an efficient Boundary Scan test structure for multiple clock testing in design.

• JSTS:Journal of Semiconductor Technology and Science
• /
• v.13 no.1
• /
• pp.71-78
• /
• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• Journal of KIISE:Computer Systems and Theory
• /
• v.34 no.2
• /
• pp.84-92
• /
• 2007

This paper proposes an interconnect delay fault test (IDFT) solution on boards and SoCs based on IEEE 1149.1 and IEEE P1500. A new IDFT system clock rising edge generator which forces output boundary scan cells to update test data at the rising edge of system clock and input boundary scan cells to capture the test data at the next rising edge of the system clock is introduced. Using this proposed circuit, IDFT for interconnects synchronized to different system clocks in frequency can be achieved efficiently. Moreover, the proposed IDFT technique does not require any modification of the boundary scan cells or the standard TAP controller and simplifies the test procedure and reduces the area overhead.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.8 no.6
• /
• pp.1153-1157
• /
• 2004

This paper describes a new programmable DLL_based frequency synthesizer. Generally, PLLs have been used for frequency synthesis. Inherent fast locking DLLs are also used for frequency synthesis. However, DLL needs a frequency multiplier for various frequencies. A conventional frequency multiplier used in DLL has a restriction in which a multiple is fixed. However, the proposed DLL can generate clocks which are from 6 times to 10 times of the reference clock. Frequency range of the proposed DLL is from 600MHz to 1GHz. The idea has been confirmed by HSPICE simulations in a $0.35-\mu\textrm{m}$ CMOS process.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.42 no.5 s.335
• /
• pp.39-46
• /
• 2005

This paper introduces a new At-speed Interconnect Test Controller (ASITC) that can detect and diagnose dynamic as well as static defects in an SoC. SoC is comprised of IEEE 1149.1 and P1500 wrapped cores which can be operated by multiple system clocks. In other to test such a complicated SoC, we designed a interface module for P1500 wrapped cores and the ASITC that makes it possible to detect interconnect delay faults during 1 system clock from launching to capturing the transition signal. The ASITC proposed requires less area overhead than other approaches and the operation was verified through the FPGA implementation