• Journal of Applied Reliability
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• v.13 no.2
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• pp.99-107
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• 2013

One-shot device is required to successfully perform its function only once at the moment of use. The reliability of a one-shot device should be expressed as a probability of success. In this paper, we propose a bayesian approach for estimating reliability of one-shot devices with small sample size. We employ a gamma prior to obtain the posterior distribution. Finally, we compare the accuracy of the proposed method with general maximum likelihood method.

• Journal of Applied Reliability
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• v.14 no.4
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• pp.225-229
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• 2014

A one-shot device is defined as a product, system, weapon, or equipment that can be used only once. After use, the device is destroyed or must undergo extensive rebuild. Determining the reliability of a one-shot device poses a unique challenge to the manufacturers and users due to the destructive nature and costs of the testing. This paper presents a reliability growth prediction for a one-shot system. It is assumed that 1) test duration is discrete(i.e. trials or rounds); 2) trials are statistically independent; 3) the number of failures for a given system configuration is distributed according to a binomial distribution; and 4) the cumulative expected number of failures through any sequence of configurations is given by AMSAA model. When the system development is represented by three configurations and the number of trials and failures during configurations are given, the AMSAA model parameters and reliability at configuration 3 are estimated by using a reliability growth analysis software. Further, if the reliability growth predictions do not meet the target reliability, the sample size of an additional test is determined for achieving the target reliability.

• Journal of Applied Reliability
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• v.14 no.3
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• pp.162-168
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• 2014

This paper discusses the application of Bayesian techniques with test data on similar products for performing the Economical Reliability Test of new one-shot device. Using the test data on similar products, reliability test required lower sample size currently being spent in order to demonstrate a target reliability with a specified confidence level. Furthermore, lower sample size reduces cost, time and various resources on reliability test. In this paper, we use similarity as calculating weight of similar products and analyze similarity between new and similar product for comparison of the essential function.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.40 no.4
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• pp.96-104
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• 2017

A one-shot system (device) refers to a system that is stored for a long period of time and is then disposed of after a single mission because it is accompanied by a chemical reaction or physical destruction when it operates, such as shells, munitions in a defense weapon system and automobile airbags. Because these systems are primarily related with safety and life, it is required to maintain a high level of storage reliability. Storage reliability is the probability that the system will operate at a particular point in time after storage. Since the stored one-shot system can be confirmed only through inspection, periodic inspection and maintenance should be performed to maintain a high level of storage reliability. Since the one-shot system is characterized by a large loss in the event of a failure, it is necessary to determine an appropriate inspection period to maintain the storage reliability above the reliability goal. In this study, we propose an optimal inspection policy that minimizes the total cost while exceeding the reliability goal that the storage reliability is set in advance for the one-shot system in which periodic inspections are performed. We assume that the failure time is the Weibull distribution. And the cost model is presented considering the existing storage reliability model by Martinez and Kim et al. The cost components to be included in the cost model are the cost of inspection $c_1$, the cost of loss per unit time between failure and detection $c_2$, the cost of minimum repair of the detected breakdown of units $c_3$, and the overhaul cost $c_4$ of $R_s{\leq}R_g$. And in this paper, we will determine the optimal inspection policy to find the inspection period and number of tests that minimize the expected cost per unit time from the finite lifetime to the overhaul. Compare them through numerical examples.

• Industry Promotion Research
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• v.7 no.4
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• pp.1-8
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• 2022

There are many one-shot devices that are used once and thrown away. One-shot devices such as firecrackers and ammunition are typical, and they are stored for a while after manufacture and then disposed of after use when necessary. However, unlike general operating systems, these one-shot devices have not been properly evaluated. This study first examines what the government does to secure reliability in the case of ammunition through ammunition stockpile reliability program. Next, in terms of statistical analysis, we show what the reliability analysis methods are for one-shot devices such as ammunition. Specifically, we show that it is possible to know the level of reliability if sampling inspection plan such as KS Q 0001 which is acceptance sampling plan by attributes is used. Next, non-parametric and parametric methods are introduced as ways to determine the storage reliability of ammunition. Among non-parametric methods, Kaplan-Meier method can be used since it can also handle censored data. Among parametric methods, Weibull distribution can be used to determine the storage reliability of ammunition.

• Proceedings of the Korean Society of Marine Engineers Conference
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• 2001.11a
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• pp.120-124
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• 2001

A new technique for improving the efficiency of single-phase high-frequency boost converter is proposed. This converter includes an additional low-frequency boost converter which is connected to the main high-frequency switching device in parallel. The additional converter is controlled at lower frequency. Most of the current flows in the low-frequency switch and so, high-frequency switching loss is greatly reduced accordingly Both switching device are controlled by a simple method; each controller consists of a one-shot multivibrator, a comparator and an AND gate. The converter works cooperatively in high efficiency and acts as if it were a conventional high-frequency boost converter with one switching device. The proposed method is verified by simulation. This paper describes the converter configuration and design, and discusses the steady-state performance concerning the switching loss reduction and efficiency improvement.

• Journal of Korean Ophthalmic Optics Society
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• v.13 no.1
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• pp.65-69
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• 2008

Purpose: To develop a dot sight device for a sighting shot using the doublet reflector. Methods: We designed the singlet reflector and the doublet reflector by Sigma 2000 program and compared the one to the other. Results: In analysis of finite ray aberration, we could confirm that it has the effective field of view with the free-parallax which is 3.3 times wider than the existing dot sight device using the singlet reflector. If you use the doublet reflector, the central thickness of optical system become more than two times bigger than the existing one. As a result, when the image of a target object is made on the observer's retina, if you make the first side's radius of curvature equal with the second one as the case of the singlet reflector, changes in magnification are appeared. To conquer this problem, we had to make be satisfied with the afocal condition in the case of doublet reflector. Conclusions: we could develop the dot sight device for a sighting shot using the doublet reflector which has the effective field of view with the free-parallax which is 3.3 times wider than the existing dot sight device using the singlet reflector.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2022.10a
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• pp.553-555
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• 2022

This paper is about a real-time automatic face recognition system based on one-shot panoramic scanning. It detects multiple faces in real time through a single panoramic scanning process and recognizes pre-registered faces. Instead of recognizing multiple faces within a single panoramic image, multiple faces are recognized using multiple images obtained in the scanning process. This reduces the panorama image creation time and stitching error, and at the same time can improve the face recognition performance by using the accumulated information of multiple images. It is expected that it can be used in various applications such as a multi-person smart attendance system with only a simple image acquisition device.

• Journal of the Korea Institute of Military Science and Technology
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• v.20 no.6
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• pp.844-852
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• 2017

Since guided weapon is high-cost and one-shot device which is non-reusable, it requires a lot of resources to prove required accuracy as a part of reliability demonstration. Once a test for proving accuracy rate of guided missile fails, it causes an additional cost and delay of schedule. This study introduces an equation for proper sample size and plan for guided-missile accuracy rate test in order to minimize the risk of test failure. Proper sample size for the test is derived by considering the reliability growth. Furthermore, each task for accuracy rate test is defined according to the development step. Therefore, this study can contribute to reduce sample size for accuracy rate test in order to meet the reliability requirement and assure transparency in the test process.

• Journal of the Korea Institute of Military Science and Technology
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• v.20 no.2
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• pp.225-230
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• 2017

To generate mechanical movements in one-shot devices such as missiles and space launch vehicles, pyrotechnic mechanical device(PMD) such as pin pullers using pyrotechnic charge has been widely used. Reliability prediction of pin pullers is crucial to successfully execute target missions for the one-shot devices. Because the pin pullers require destructive tests to evaluate their reliability, one would need about 3,000 samples of success to guarantee a reliability of 99.9 % with a confidence level of 95 %. This paper suggests the application of a probit model using the charge amount as a functional parameter for estimation of functional reliability of pin puller. To guarantee target reliability, we propose estimation methods of the lower bound of functional reliability by applying the probit model. Given lower bound of functional reliability, we quantitatively show that the optimum amount of charge increases as the number of samples decreases. Along with a variety of simulations the validity of our new model via real test results is confirmed.