• The Journal of the Korea institute of electronic communication sciences
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• v.13 no.2
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• pp.333-340
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• 2018

This paper introduces a BCH code decoder using parallel CRC(: Cyclic Redundancy Check) generation. Using a conventional parallel syndrome generator with a LFSR(: Linear Feedback Shift Register), it takes up a lot of space for a short code. The proposed decoder uses the parallel CRC method that is widely used to compute the checksum. This scheme optimizes the a syndrome generator in the decoder by eliminating redundant xor operation compared with the parallel LFSR and thus minimizes chip area and propagation delay. In simulation results, the proposed decoder has accomplished propagation delay reduction of 2.01 ns as compared to the conventional scheme. The proposed decoder has been designed and synthesized in $0.35-{\mu}m$ CMOS process.

• Journal of Korea Society of Digital Industry and Information Management
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• v.11 no.3
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• pp.31-43
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• 2015

In this paper, we discuss a code generation technique for custom transport triggered architecture (TTA) from a high-level language structure. This methodology is implemented by using TTA-based Co-design Environment (TCE) tool. The results show how the scheduler exploits instruction level parallelism in the custom target architecture and source program. Thus, the scheduler generates parallel TTA instructions using lower cycle counts than the sequential scheduling algorithm. Moreover, we take Tensilica tool to make a comparison with TCE. Because of the efficiency of TTA, TCE takes less execution cycles compared to Tensilica configurations. Finally, this paper shows that it requires only 7 cycles to generate the parallel TTA instruction set for implementing Cyclic Redundancy Check (CRC) applications as an input design, and presents the code generation technique to move complexity from the processor software to hardware architecture. This method can be applicable lots of channel Codecs like CRC and source Codecs like High Efficiency Video Coding (HEVC).

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.7
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• pp.63-70
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• 2004

This paper describes the link layer and physical layer of the Serial ATA which is the next generation for parallel ATA specification that defines data transfer between PC and peripheral storage devices. The link layer consists of CRC generation/error detection, 8b/10b decoding/encoding, primitive generation/detection block. For the physical layer, it includes CDR(Cock Data Recovery), transmission PLL, serializer/de-serializer. It also includes generation and receipt of OOB(Out-Of-Band) signal, impedance calibration, squelch circuit and comma detection/generation. Additionally, this chip includes TCB(Test Control Block) and BIST(Built-In Selt Test) block to ease debugging and verification. It is fabricated with 0.18${\mu}{\textrm}{m}$ standard CMOS cell library. All the function of the link layer operate properly. For the physical layer, all the blocks operate properly but the data transfer is limited to the 1.28Gbps. This is doe to the affection or parasitic elements and is verified with SPICE simulation.