• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.7
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• pp.89-95
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• 2014

An LED lighting which adjusted brightness according to the surround ambient implemented using PWM technology and power devices. To measure the brightness of surround ambient a CdS sensor was used. A control board for the generation of the PWM signal was made using a MCU and duty ratio was controlled according to light intensity of surround ambient of the system. To drive the LED lamps which require high-voltage and high-current power devices were used for switching the DC power supply. Measurement results show that the IGBT is excellent as only lineality but the PowerBJT is more good to consider to efficiency and cost.

• Journal of IKEEE
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• v.6 no.2 s.11
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• pp.119-127
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• 2002

An algorithm for analyzing the characteristics of the power BJT using numerical analysis method is proposed. The Fermi-Dirac statistics is used to calculate the carrier concentration in highly doped region. Philips Unified mobility model, SRH model and Auger model is used to calculate the recombination current of base region. To verify the accuracy of the proposed method, the collector current of BANDIS is compared with the measured data in the condition of the base current increased from $1.0[{\mu}A]\;to\;3.5[{\mu}A]$. The collector current of BANDIS show a maximum relative error within 8.9% compared with the measured data.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.40 no.6
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• pp.16-23
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• 2003

In this paper, we propose an efficient bias circuit of discrete BJT component for hearing aid. The collector feedback bias circuit, widely used for the hearing aid, has a resistor for negative feedback. As the resistor affects AC and DC simultaneously, it is quite difficult to adjust amplifier gain without changing DC bias point. The previous bias circuit also has weak point to be oscillated by the positive feedback of power noise if gain of hearing aid is high. In the proposed circuit, we can reduce the two weak points of the previous circuit by adding a resistor to the collector feedback bias circuit between base and power supply which is $\beta$ times target than the collector resistor. Thus. we can change amplifier gain without changing DC bias point, and reduce power noise gain about 18.5% compare to that of tile previous circuit in the simulation.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.5
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• pp.15-21
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• 2004

In this paper a new structure of BJT is proposed to improve the saturation voltage characteristics so that it can be used to the low power switching devices. In the case of the conventional finger transistor(FT), the saturation voltage is so high that it dose not satisfy the requirements for the low power device. So the other multi base island transistor(MBIT) is suggested and its saturation voltage is so low in the region of low current that it satisfy the requirement for the low power switching devices, but in region of the high current the saturation voltage tends to increase so that it does not satisfy the requirements for the low power switching devices. So in this paper a new structure of folded back electrode transistor(FBET) is proposed and the characteristics is investigated. When the new structure is applied the emitter area is increased by 35 % so the saturation voltage is reduced by 30 % at the low current region and the contact area is increased by 92 % so the saturation voltage is reduced by totally f % at the high current region with the reduction of 30 % by the increase of the emitter area and the reduction of 7 % by the increase of the emitter contact area.

• Proceedings of the IEEK Conference
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• 2002.06e
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• pp.231-234
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• 2002

In this paper, we propose an efficient bias circuit for hearing aid using discrete BJT. The collector feedback bias circuit, widely used for the hearing aid, has a resister for negative feedback. As the resistor affects AC and DC simultaneously, it is quite difficult to adjust amplifier gain without changing DC bias point. The previous bias circuit also has weak point to be oscillated by the positive feedback of power noise if gain of hearing aid is high. In the proposed circuit, we can reduce the two weak points of the previous circuit by adding a resistor which is ${\beta}$ times larger than collector resistor between base of BJT and power supply.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.27 no.3
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• pp.167-171
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• 2014

This paper examines the destruction behavior of NPN BJT (bipolar junction transistor) by repetition pulse. The injected pulse has a rise time of 1 ns and the maximum peak voltage of 2 kV. Pulse was injected into the base of transistor. Transistor was destroyed, current flows even when the base power is turned off. Cause the destruction of the transistor is damaged by heat. Breakdown voltage of the transistor is 975 V at single pulse, and repetition pulse is 525~575 V. Pulse repetition rate increases, the DT (destruction threshold) is reduced. Pulse Repetition rate is high, level of transistor destruction is more serious.

• 제어로봇시스템학회:학술대회논문집
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• 2003.10a
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• pp.2287-2290
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• 2003

The electrical characteristics of power devices such as BJT (Bipolar Junction Transistor), and MOSFET (Metal Oxide Field Effect Transistor), etc, are altered due to impinging photon radiation and temperature in the nuclear or the space environment. In this paper, BJT and MOSFET are the two devices subjected to ${\gamma}$ radiation. In the case of BJT, the current gain (${\beta}$) and the collector to Emiter breakdown voltage ($V_{CEO}$) are the two main parameters considered. When it was subjected to ${\gamma}$ rays, the ${\beta}$ decreases as the dose level increases, whereas, $V_{CEO}$ gradually increases as the dose level increases. In the case of MOSFET, the threshold voltage is decreasing as the dose level increases. Here it has been observed the decent rate is an increasing function of the threshold voltage. The on-resistance does not change with respect to the dose. Both the devices recover back the original specification after the annealing is finished. No permanent damage has been occurred.

• Journal of IKEEE
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• v.25 no.2
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• pp.350-355
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• 2021

IGBT is a power semiconductor device that contains both MOSFET and BJT structures, and it has fast switching speed of MOSFET, high breakdown voltage and high current of BJT characteristics. IGBT is a device that targets the requirements of an ideal power semiconductor device with high breakdown voltage, low V_CE-SAT, fast switching speed and high reliability. In this paper, we analyzed Gate oxide thickness, Trench Gate Width, and P+Emitter width, which are the top process parameters of 1,200V Trench Gate Field Stop IGBT, and suggested the optimized top process parameters. Using the Synopsys T-CAD Simulator, we designed IGBT devices with electrical characteristics that has breakdown voltage of 1,470 V, V_CE-SAT 2.17 V, Eon 0.361 mJ and Eoff 1.152 mJ.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.6
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• pp.2707-2712
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• 2011

In this paper, a power factor correction (PFC) control circuit using single stage boundary conduction mode(BCM) for the 400V. 120W LED drive application has been designed. The proposed control circuit is aimed for improvement of the power factor correction and reduction of the total harmonic distortion. In this circuit, a new CMOS multiplier structure is used instead of a conventional BJT(bipolar junction transistor) based multiplier where has a relatively large area. The CMOS multiplier can bring 30 % reduced chip area, competitive die cost in comparison with the conventional BJT multiplier.

• JSTS:Journal of Semiconductor Technology and Science
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• v.14 no.3
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• pp.339-344
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• 2014

This paper presents a novel bipolar junction transistor (BJT) based electrostatic discharge (ESD) protection device. This protection device was designed for 20V power clamps and fabricated by a process with Bipolar-CMOS-DMOS (BCD) $0.18{\mu}m$. The current-voltage characteristics of this protection device was verified by the transmission line pulse (TLP) system and the DC BV characteristic was verified by using a semiconductor parameter analyzer. From the experimental results, the proposed device has a trigger voltage of 29.1V, holding voltage of 22.4V and low on-resistance of approximately $1.6{\Omega}$. In addition, the test of ESD robustness showed that the ESD successfully passed through human body model (HBM) 8kV. In this paper, the operational mechanism of this protection device was investigated by structural analysis of the proposed device. In addition, the proposed device were obtained as stack structures and verified.