• Journal of Korea Port Economic Association
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• v.26 no.1
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• pp.144-171
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• 2010

The purpose of this study is to propose the effective method to improve the competitive power in the Busan container terminal. To achieve this, we analyzed the present of the shift pattern in the container terminal, and identified the problems in the pattern. This study shows the issues of shift pattern for field employee in Busan container terminal and also improvement plan to solve them. We suggested two approaches as an effective approach; the flexible use of employees through overtime, use of workers pool among terminals, and outsourcing; the promotion of welfare by leisure, fitness, and community service.

• International Journal of Advanced Culture Technology
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• v.8 no.4
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• pp.161-166
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• 2020

The primary aim of this paper is to analyze the resultative adjunct clause, i.e., (thus/thereby/hence) ~ing participle and provide explicit syntactic, semantic and sociolinguistic explanation on the question what causes the cause-focused causal construction with resultative (thus/thereby/hence) ~ing participle in English. What comes first is either cause or effect clause. This study explores the recent style shift of causal constructions from the effect-focused pattern to the cause-focused pattern. In this study, we argue that the increasing number of the cause-focused main clause with a resultative ~ing participle clause shows the process of the style evolution improving speech/wring style in many respects including syntactic simplification, clarification of the sentence meaning with impact on the focused clauses, and improvement of the flow of speech/writing. The style shift found in the English resultative adjunct clauses, i.e., (thus/hence/thereby) ~ing participle constructions prove to be the style evolution from syntactic, semantic and sociolinguistic point of views.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2005.05a
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• pp.143-145
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• 2005

We present the method to obtain four speckle patterns with relative phase shift of ${\pi}/2$ passive devices such as wave plate and polarizer, and calculate the phase at each point of the speckle pattern in shearographic system using Wollaston pin And, we analyzed the phase error caused by wave plates used in the proposed method by Jones matrix.

• Journal of the Korean Institute of Telematics and Electronics B
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• v.29B no.9
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• pp.1-7
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• 1992

This paper proposes a built-in self-test tchnique for CMOS circuits. To detect a stuck-open fault in CMOS circuits, two consequent test patterns is required. The ordered pairs of test patterns for stuck-open faults are generated by feedback shift registers of extended length. A nonlinear feedback shift register is designed by the merging method and reordering algorithms of test patterns proposed in this paper. And a new multifunctional BILBO (Built-In Logic Block Observer) is designed to perform both test pattern generation and signature analysis efficiently.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.21 no.1
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• pp.58-64
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• 2012

Instead of the surface pattern arranged repeatedly in two axial direction on a plane, we propose double patterns superposing two one-axial linear patterns as a reference target for surface encoding. A upper layer of the superposed pattern is the transparent glass with grooves cut in it at a fixed pitch. The position is sensed by detecting a shift of beam due to difference of a refractive index. And a lower layer is the aluminum with color-coated grooves. The amount of beam reflected on the layer varies according to its targeting position and is detected for encoding. For the above reference pattern, we can detect two-axial positions using only the single beam. Furthermore, the pattern size can be expanded with a size of the detector kept constant, meaning that the measured range can be expanded easily. In this paper, we review the existing optical encoding methods for grid pattern, and discuss the hardware implementation of the suggested surface encoding method.

• Journal of the Institute of Electronics and Information Engineers
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• v.51 no.6
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• pp.110-116
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• 2014

Pattern matching algorithms are widely used in computer security systems such as computer networks, ubiquitous networks, sensor networks, and so on. However, the advances in information technology causes grow on the amount of data and increase on the computation complexity of pattern matching processes. Therefore, there is a strong demand for a novel high performance pattern matching algorithms. In light of this fact, this paper newly proposes a suffix tree based pattern matching algorithm. The suffix tree is constructed based on the suffix values of all patterns. Then, the shift nodes which informs how many characters can be skipped without matching operations are added to the suffix tree in order to boost matching performance. The proposed algorithm reduces memory usage on the suffix tree and the amount of matching operations by the shift nodes. From the performance evaluation, our algorithm achieved 24% performance gain compared with the traditional algorithm named as Wu-Manber.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 1998.03a
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• pp.239-244
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• 1998

ESP(Electronic Speckle Pattern Interferometry) is an optical technique to measure deforamtion of engineering components and materials in industrial areas. ESPI, a non-contact and non-destructive measuring method, is capable of providing full-field results with high spatial resolution and high speed. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The electronic speckle contouring is suitable for providing measurement range from millimeters to several centimeters. In this study, we introduce the contouring method by modified dual-beam speckle pattern interferometer and a shift of the two illumination beams through optical fiber in order to obtain the contour fringe patterns. Before the experiments, we performed the geometric analysis for dual-beam-shifted ESPI contouring. And by this geometric analysis, we performed the electronic speckle contouring experiment. We used 4-frame phase shifting method with PZT for quantitative analysis of contour fringes. Finally, we showed good agreements between the geometric analysis and experimental results.

• Smart Structures and Systems
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• v.17 no.6
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• pp.935-956
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• 2016

With the help of advanced image acquisition and processing technology, the vision-based measurement methods have been broadly applied to implement the structural monitoring and condition identification of civil engineering structures. Many noncontact approaches enabled by different digital image processing algorithms are developed to overcome the problems in conventional structural dynamic displacement measurement. This paper presents three kinds of image processing algorithms for structural dynamic displacement measurement, i.e., the grayscale pattern matching (GPM) algorithm, the color pattern matching (CPM) algorithm, and the mean shift tracking (MST) algorithm. A vision-based system programmed with the three image processing algorithms is developed for multi-point structural dynamic displacement measurement. The dynamic displacement time histories of multiple vision points are simultaneously measured by the vision-based system and the magnetostrictive displacement sensor (MDS) during the laboratory shaking table tests of a three-story steel frame model. The comparative analysis results indicate that the developed vision-based system exhibits excellent performance in structural dynamic displacement measurement by use of the three different image processing algorithms. The field application experiments are also carried out on an arch bridge for the measurement of displacement influence lines during the loading tests to validate the effectiveness of the vision-based system.

• Current Optics and Photonics
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• v.1 no.5
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• pp.505-513
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• 2017

Measuring the thickness of thin films is strongly required in the display industry. In recent years, as the size of a pattern has become smaller, the substrate has become larger. Consequently, measuring the thickness of the thin film over a wide area with low spatial sampling size has become a key technique of manufacturing-yield management. Interferometry is a well-known metrology technique that offers low spatial sampling size and the ability to measure a wide area; however, there are some limitations in measuring the thickness of the thin film. This paper proposes a method to calculate the thickness of the thin film in the following two steps: first, pre-estimation of the thickness with the phase at the peak position of the interferogram at the bottom surface of the thin film, using white-light phase-shift interferometry; second, accurate correction of the measurement by fitting the interferogram with the theoretical pattern through the estimated thickness. Feasibility and accuracy of the method has been verified by comparing measured values of photoresist pattern samples, manufactured with the halftone display process, to those measured by AFM. As a result, an area of $880{\times}640$ pixels could be measured in 3 seconds, with a measurement error of less than 12%.

• Korean Journal of Optics and Photonics
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• v.18 no.5
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• pp.303-308
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• 2007

We report here on the application of a digital holographic microscope as a metrology tool for the inspection and the micro-topography reconstruction of different micro-structures of phase shift photo-mask (PSM). The lithography by phase shift photo-mask uses the interference and the pattern of the PSM is not imaged by general optical microscope. The technique allows us to obtain digitally a high-fidelity surface topography description of the phase shift photo-mask with only one hologram image acquisition, allowing us to have relatively simple and compact set-ups able to give quantitative information of PSM.