• Title/Summary/Keyword: TFT-LCD

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a-Si TFT based systems on TFT-LCD panels

  • Wang, Wen-Chun;Chan, Chien-Ting;Han, Hsi-Rong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08b
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    • pp.1168-1171
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    • 2007
  • Integrating systems on TFT-LCD panels is more and more popular for the mobile display application. However, it may not be necessary to use LTPS TFT devices. A-Si TFTs are used to integrate systems on TFT-LCD panels, especially scan (gate) drivers. To further reduce the chip size of driver IC, the triplegate pixel structure is developed. Therefore, the number of the source lines is reduced to 1/3 times.

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A Study of Production Scheduling Scheme in TFT-LCD Factory (TFT-LCD 공장의 생산계획 수립에 관한 연구)

  • Na, Hyeok-Jun;Baek, Jong-Kwan;Kim, Sung-Shick
    • IE interfaces
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    • v.15 no.4
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    • pp.325-337
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    • 2002
  • In this study we consider the problem of production planning of TFT-LCD(Thin Film Transistor - Liquid Crystal Display) production factory. Due to the complexities of the TFT-LCD production processes, it is difficult to schedule the production planning, and the study about automated scheduler is insufficient. In addition, the existing production method is a Push-System to raise the operation rate with expensive equipment, that has the problem to satisfy the due-date. This study presents an algorithm having a concept of Pull-System that satisfies the due-date and considers specialties of TFT-LCD production process. We make MPS(Master Production Schedule) according to the sales order, and present algorithms for scheduling about In/Out plan considering factory capacity, line balancing, material requirement, and inventory level of all Array, Cell, and Module processes. These algorithms are integrated as an automated production system, and we implement them in the actual TFT-LCD factory circumstance.

A study on the detection probabilities of pixel defects with respect to their locations on the TFT-LCD (TFT-LCD의 품질검사기준 설정을 위한 픽셀결점 탐지도 평가)

  • 김상호;양승준
    • Proceedings of the Safety Management and Science Conference
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    • 2004.05a
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    • pp.283-289
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    • 2004
  • The number of pixel defects including bright and black dots on a panel is one of the critical factors determining the quality of TFT-LCD. Since pixel defects on the TFT-LCD panels are sometimes unavoidable, manufacturers have to inspect the panels so that any panel with an unacceptable number of defects will not be delivered to the buyers. However, the buyers demand for the manufacturers to meet different pixel defects tolerances (acceptable number of pixel defects on a TFT-LCD panel) around central(tight) and peripheral(loose) inspection zones. The disagreement in quality standard among different buyers also cause confusions in screening non-confirmative products and unstable yield of production. Few research has focused on the effects of defect locations on a TFT-LCD panel on their detection probabilities and the rational division of defect inspection zones. In this research, experiments were conducted to find the detection probabilities of black dot defects with respect to their varying locations on a TFT-LCD. It is proposed a rational division of inspection zone on a TFT-LCD panel on the basis of detection probabilities of the defects. With these division of inspection zones and the mean defect detection probability within each zone, it is expected to establish a more reasonable pixel defects tolerances.

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TFT-LCD Defect Detection Using Multi-level Threshold and Probability Density Function (다단계 임계화와 확률 밀도 함수를 이용한 TFT-LCD 결함 검출)

  • Kim, Se-Yun;Jung, Chang-Do;Yun, Byoung-Ju;Joo, Young-Bok;Choi, Byung-Jae;Park, Kil-Houm
    • Journal of the Korean Institute of Intelligent Systems
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    • v.19 no.5
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    • pp.615-621
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    • 2009
  • TFT-LCD image consists of ununiform background, random noises and target defect signal components. Defects in TFT-LCD have some intensity variations compared to background region. It is sometimes difficult for human inspectors to figure out. In this paper, we propose multi-level threshold scheme for detection of the real defect using probability density function with Parzen Window. The experimental results show that the proposed algorithms produce promising results and can be applied to automated inspection systems for finding defects in the TFT-LCD image.

Research of Measurement and Evaluation of White Uniformity Considering Visual Angle on TFT-LCD (TFT-LCD에서 시야각을 고려한 White Uniformity 측정 및 평가에 대한 연구)

  • Chang, Sung-Ho;Seo, Sang-Won
    • Journal of the Ergonomics Society of Korea
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    • v.26 no.4
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    • pp.33-39
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    • 2007
  • In the full white pattern, white uniformity means the degree of uniform distribution of white color and luminance across the whole screen. Among the FPDs(Flat Panel Displays), the TFT-LCD has weak point of viewing angle. The viewing angle considering location and direction can cause different image quality of the TFT-LCD. Therefore, white uniformity of the TFT-LCD must consider viewing angle. Based on international standards, this study proposes an alternative that is realistic and ergonomic measurement of white uniformity of the TFT-LCD.

The Study of Impact Analysis of TFT-LCD Module (TFT-LCD 모듈의 충격해석에 관한 연구)

  • Lee, Jeoung-Gwen;Choi, Sung-Sik
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.28 no.5
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    • pp.571-577
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    • 2004
  • The impact behavior of TFT-LCD module is very complicated because the module is assisted with three parts such as back light unit, LCD Panel and top chassis. Especially, the back light unit is constructed with several small and thin parts made by plastics or steels. The design of the back light unit is very important because the recent demand is more lighter, thinner and narrower module. The aim of the present study is the investigation of mechanical characteristics during impact loading. The back light unit must assist TFT-LCD Panel made by glass and guide qualification of handling environment. This paper focus on the dynamic behavior of module and carries out a series of computer simulation using LS-DYNA program. Comparing with test results previously performed, dynamic characteristics of TFT-LCD module are estimated.

Development of a 30-in. wide-QXGA+ TFT-LCD for High-Information-Content Displays

  • Choi, H.C.;Hong, S.G.;Lim, B.H.;Lee, S.W.;Yeo, S.D.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.19-22
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    • 2004
  • A 30-inch WQXGA+ TFT-LCD Monitor has been developed based on in-plane switching mode with multi-domain. This product adopts Cu electrode which, in spite of low resistivity, was not applied to TFT LCD products because of productivity and reliability problems etc. This low resistivity material makes it possible to clear the problem caused by line delay in such high resolution TFT-LCDs. As a results of successful adoption of innovative materials and technologies, our world's largest TFT-LCD Monitor has best performance for high information display.

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TFT-LCD Mura Detection Algorithm Using Multi-point FFT (Multi-point FFT를 이용한 TFT-LCD 결함 검출 알고리즘)

  • Jang, Young-Beom;Ha, Jun-Hyung;Yu, Dong-In
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.10 no.3
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    • pp.529-534
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    • 2009
  • In this paper, we propose a new algorithm which can detect Mura in TPT-LCD effectively. Since Mura in TFT-LCD has a certain area shape, it is seen as a sin wave in a LCD line. Consequently, it is shown that this type of Mura can be detected easily through FFT. Even multiple size of Mura patterns exist, those patterns can be detected with multi-point FFT. Proposed algorithm can be utilized in automatic Mura detection systems instead of human Mura detection methods.

Segmentation of Defective Regions based on Logical Discernment and Multiple Windows for Inspection of TFT-LCD Panels (TFT-LCD 패널 검사를 위한 지역적 분별에 기반한 결함 영역 분할 알고리즘)

  • Chung, Gun-Hee;Chung, Chang-Do;Yun, Byung-Ju;Lee, Joon-Jae;Park, Kil-Houm
    • Journal of Korea Multimedia Society
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    • v.15 no.2
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    • pp.204-214
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    • 2012
  • This paper proposes an image segmentation for a vision-based automated defect inspection system on surface image of TFT-LCD(Thin Film Transistor Liquid Crystal Display) panels. TFT-LCD images have non-uniform brightness, which is hard to finding defective regions. Although there are several methods or proposed algorithms, it is difficult to divide the defect with high reliability because of non-uniform properties in the image. Kamel and Zhao disclosed a method which based on logical stage algorithm for segmentation of graphics and character. This method is a one of the local segmentation method that has a advantage. It is that characters and graphics are well segmented in an image which has non-uniform property. As TFT-LCD panel image has a same property, so this paper proposes new algorithm to segment regions of defects based on Kamel and Zhao's algorithm. Our algorithm has an advantage that there are a few ghost objects around the defects. We had experiments to prove performance in real TFT-LCD panel images, and comparing with the FFT(Fast Fourier Transform) method which is used a bandpass filter.

Defect detection based on periodic cell pattern elimination in TFT-LCD cell images (TFT-LCD 셀 영상에서 주기적인 셀 패턴 제거 기반 결함검출)

  • Jung, Yeong-Tak;Lee, Seung-Min;Park, Kil-Houm
    • Journal of Advanced Marine Engineering and Technology
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    • v.41 no.3
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    • pp.251-257
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    • 2017
  • In this paper, an algorithm for detecting defects in thin-film-transistor liquid-crystal display (TFT-LCD) cell images is presented. TFT-LCD cell images typically contain periodic cell patterns that make it difficult to detect defects. We propose an efficient and powerful algorithm for eliminating the cell patterns using magnitude spectrum analysis. The first step was to obtain a spectrum for a cell image using the Fourier transform while eliminating larger coefficients using an adaptive filter. Next, an image without the cell pattern was obtained by using the inverse Fourier transform. Finally, the defect pixels were detected using the STD algorithm. The validity of the proposed method was investigated using real TFT-LCD cell images. The experimental results indicate that the proposed technique is extremely effective for detecting defects in TFT-LCD cell images.