• Journal of IKEEE
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• v.24 no.3
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• pp.719-726
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• 2020

A threshold-voltage sensing circuit is proposed to compensate for pixel aging in active matrix organic light-emitting diodes. The proposed threshold-voltage sensing circuit consists of sample-hold (S/H) circuits and a single-ended successive approximation register (SAR) analog-to-digital converter (ADC) with a resolution of 10 bits. To remove a scale down converter of each S/H circuit and a voltage gain amplifier with a signl-to-differentail converter, the middle reference voltage calibration and input range calibration for the single-ended SAR ADC are performed in the capacitor digital-to-analog converter and reference driver. The proposed threshold-voltage sensing circuit is designed by using a 180-nm CMOS process with a supply voltage of 1.8 V. The ENOB and power consimption of the single-ended SAR ADC are 9.425 bit and 2.83 mW, respectively.

• JSTS:Journal of Semiconductor Technology and Science
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• v.7 no.2
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• pp.67-75
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• 2007

To improve low sense margin at low voltage, we propose a negatively driven sensing (NDS) scheme and to solve the problem of WL-to-BL short leakage fail, a variable bitline reference scheme with free-level precharged bitline (FLPB) scheme is adopted. The influence of the threshold voltage offset of NMOS and PMOS transistors in a latch type sense amplifier is very important factor these days. From evaluating the sense amplifier offset voltage distribution of NMOS and PMOS, it is well known that PMOS has larger distribution in threshold voltage variation than that of NMOS. The negatively-driven sensing (NDS) scheme enhances the NMOS amplifying ability. The offset voltage distribution is overcome by NMOS activation with NDS scheme first and PMOS activation followed by time delay. The sense amplifier takes a negative voltage during the sensing and amplifying period. The negative voltage of NDS scheme is about -0.3V to -0.6V. The performance of the NDS scheme for DRAM at the gigabit level has been verified through its realization on 1-Gb DDR2 DRAM chip.

• 한국정보디스플레이학회:학술대회논문집
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• 2008.10a
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• pp.517-520
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• 2008

A voltage-programming pixel circuit, which compensates the threshold voltage shift of TFTs and the degradation of OLED, is proposed for large sized a-Si:H active matrix organic light emitting diode (AMOLED) applications. Considering threshold voltage variation (or shift), OLED degradation and reverse bias annealing, HSPICE simulation results indicate that luminance error of every gray level is less than 0.4 LSB under the condition of +1V threshold voltage shift and from -0.2 LSB to 2.6 LSB within 30% degradation of OLED in the case of 40-inch full HDTV condition.

• 한국정보디스플레이학회:학술대회논문집
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• 2006.08a
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• pp.1697-1700
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• 2006

A Novel pixel structure with a new threshold voltage compensation technique is proposed for large-size a-Si:H AMOLED panel application. The proposed pixel improves image quality with threshold voltage compensation and alleviates annealing technique for display-off time. Sensing the threshold voltage of driving TFT for 20-inch WUXGA panel is verified by the HSPICE simulation.

• The Journal of the Korea institute of electronic communication sciences
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• v.9 no.3
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• pp.279-284
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• 2014

This paper proposes a novel OLED pixel circuit to compensate the threshold voltage variation of p-channel low temperature polycrystalline silicon thin-film transistors (LTPS TFTs). The proposed 5-TFT OLED pixel circuit consists of 4 switching TFTs, 1 OLED driving TFT and 1 capacitor. One frame of the proposed pixel circuit is divided into initialization period, threshold voltage sensing and data programming period, data holding period and emission period. SmartSpice simulation results show that the maximum error rate of OLED current is -4.06% when the threshold voltage of driving TFT varies by ${\pm}0.25V$ and that of OLED current is 9.74% when the threshold voltage of driving TFT varies by ${\pm}0.50V$. Thus, the proposed 5T1C pixel circuit can realize uniform OLED current with high immunity to the threshold voltage variation of p-channel poly-Si TFT.

• The Journal of Korea Institute of Information, Electronics, and Communication Technology
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• v.15 no.3
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• pp.205-210
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• 2022

A novel OLED pixel circuit is proposed in this paper that uses only n-type thin-film transistors(TFTs) to improve the luminance non-uniformity of the AMOLED display caused by the threshold voltage variation of an OLED driving TFT. The proposed OLED pixel circuit is composed of 6 n-channel TFTs and 2 capacitors. The operation of the proposed OLED pixel circuit consists of the capacitor initializing period, threshold voltage sensing period of an OLED·driving TFT, image data voltage writing period, and OLED·emitting period. As a result of SmartSpice simulation, when the threshold voltage of·OLED·driving TFT varies from 1.2 V to 1.8 V, the proposed OLED pixel circuit has a maximum current error of 5.18 % at IOLED = 1 nA. And, when the OLED cathode voltage rises by 0.1 V, the proposed OLED pixel circuit has very little change in the OLED current compared to the conventional OLED pixel circuit. Therefore, the proposed pixel circuit exhibits superior compensation characteristics for the threshold voltage variation of an OLED driving TFT and the rise of the OLED cathode voltage compared to the conventional OLED pixel circuit.

• Transactions on Electrical and Electronic Materials
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• v.17 no.5
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• pp.302-305
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• 2016

In this paper, a low on-resistance and high current driving capability trench gate power metal-oxide-semiconductor field-effect transistor (MOSFET) incorporating a current sensing feature is proposed and evaluated. In order to realize higher cell density, higher current driving capability, cost-effective production, and higher reliability, self-aligned trench etching and hydrogen annealing techniques are developed. While maintaining low threshold voltage and simultaneously improving gate oxide integrity, the double-layer gate oxide technology was adapted. The trench gate power MOSFET was designed with a 0.6 μm trench width and 3.0 μm cell pitch. The evaluated on-resistance and breakdown voltage of the device were less than 24 mΩ and 105 V, respectively. The measured sensing ratio was approximately 70:1. Sensing ratio variations depending on the gate applied voltage of 4 V ~ 10 V were less than 5.6%.

• Korean Journal of Metals and Materials
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• v.49 no.4
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• pp.304-312
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• 2011

In this study, MOSFET type micro hydrogen gas sensors with platinum catalytic metal gates were designed, fabricated, and their electrical characteristics were analyzed. The devised MOSFET Hydrogen Sensors, called MHS-1 and -2, were designed with a platinum gate for hydrogen gas adsorption, and an additional sensing part for higher gas sensitivity and with a micro heater for operation temperature control. In the electrical characterization of the fabricated Pt-gate MOSFET (MHS-1), the saturated drain current was 3.07 mA at 3.0 V of gate voltage, which value in calculation was most similar to measurement data. The amount of threshold voltage shift and saturated drain current increase to variation of hydrogen gas concentration were calculated and the hydrogen gas sensing properties were anticipated and analyzed.

• Proceedings of the KSRS Conference
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• 2008.10a
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• pp.96-99
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• 2008

The MRE (Monitoring Reconfiguration Electronics) board included inside the SCU (Spacecraft Computer Unit) in the COMS (Communication, Ocean and Meteorological Satellite) spacecraft is used to monitor the battery voltage and to detect a battery under voltage (low battery capacity) or a battery overvoltage (overcharge). In case of alarm detection, a reconfiguration is initiated by the MRE board. The MRE configures the overall spacecraft in the survival mode to protect the Li-Ion (lithium ion) battery from overcharge and over discharge. For the EPS (Electrical Power Subsystem) point of view, the survival mode can be trigged from hardware wired thresholds. The aim of this paper to provide and to justify the low and high threshold levels which are associated to the MRE battery voltage monitoring. The MRE trig guarantees minimum battery energy to available for the required 48 hours autonomy duration of the spacecraft after MRE trig in the survival mode.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2018.10a
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• pp.193-194
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• 2018

Common transistor has unipolar characteristics in accordance with the doping carriers and operation by the threshold voltage, which is related to the stability. It is required the low threshold voltage of transistors to increase the stability of devices. The sensing ability is about the detection of how low current, therefore there is difference between the low current and leakage current. This study researched the ambipolar characteristics of transistors with very low currents to define the difference between common n-type transistors with unipolar properties.