• 제목/요약/키워드: Voltage acceleration aging test

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Considerations on the Long-term Reliability of On-line Partial Discharge Ceramic Sensor for Thermal Power Generators and its Demonstration in the Field

  • Sun, Jong-Ho;Youn, Young-Woo;Hwang, Don-Ha;Kang, Dong-Sik
    • Journal of Electrical Engineering and Technology
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    • 제7권1호
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    • pp.103-108
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    • 2012
  • The present study describes the considerations on the long-term reliability of the on-line partial discharge (PD) ceramic sensor for thermal power generators. Voltage acceleration aging tests were carried out under continuous and impulsive thermal aging at more than $100^{\circ}C$, considering the practical service environment. Experimental results show that the sensors have a life that could last for more than 100 years, excellent dielectric characteristics, and insulation strength. In addition, the ceramic on-line PD sensors were installed in a thermal power generator in Korea for demonstration. The results of the PD calibration and test voltage application prove that the on-line ceramic sensors have satisfactory performances for on-line PD measurement.

사이리스터의 결함과 항복전압의 관계 분석 (Analysis of the relationship between breakdown voltage and defect of thyristor)

  • 이양재;서길수;김형우;김기현;김상철;김남균;김병철
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
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    • pp.149-150
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    • 2005
  • Thyristor breakdown voltage variation acceleration aging test was investigated. The breakdown voltage was deceased after 1000 hours acceleration aging test. It temperature rising caused by electric field concentration at the edge beveling region of the thyristor was confirmed using Silvaco device simulation. The local temperature rising is driving force for the defect propagation. Consequently, propagated defects of the beveling region seems to decrease thyristor's breakdown voltage.

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가속열화 시험을 통한 전력용 사이리스터 소자의 순방향/역방향 항복전압 특성변화 (Aging test for analyze the forward and reverse breakdown voltage characteristics of the thyristor)

  • 이양재;서길수;김기현;김상철;김남균;김병철
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
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    • pp.289-292
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    • 2004
  • 반도체 소자의 파괴 원인으로는 주로 열, 전압, 전류, 진동 및 압력 등이 있다. 이 중에서 전압과 열을 스트레스 인자로 적용하여 가속열화 시험을 진행하였다. 전압 및 열에 의한 소자의 열화정도를 파악하기 위해 현재 상용화되어 있는 Phase Control Thyristor 중 $V_{DRM}\;=\;1500V,\;V_{BRM}\;=\;1500V, \;T_{HS}\;=\;-40{\sim}125^{\circ}C$ 정도의 사양을 가지는 소자를 사용하였다. 열화에 의한 여러 가지 변동특성 중에서 소자의 순방향 및 역방향 항복특성의 변화와 누설전류의 변화에 대해 실험을 통해 알아보았다.

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EPDM 및 실리콘 재질의 폴리머현수애자의 특성 비교 (The Comparison of EPDM and Silicone in Housing Materials of Polymeric Suspension Insulators)

  • 이병성;이재봉;송일근;한상옥
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 춘계학술대회 논문집 유기절연재료 방전 플라즈마연구회
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    • pp.6-10
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    • 2003
  • In our country, the housing materials of polymeric outdoor insulators have mainly been used EPDM or silicone rubber. EPDM housing materials had been widely used in the field for the first time. The reason why silicone has the high cost of production. But recently, most of the manufacturers that newly developed polymeric insulators make its choice of silicone housing. EPDM showed a good resistance to tracking. We compared the various characteristics for EPDM and silicone insulators that have similar type and design. Silicone insulators have more performance in flashover voltage test and leakage current measurement because of a good water repellent than EPDM ones. Also, the property of EPDM compared with silicone insulators greatly decreased after aging test in combined acceleration ageing facilities for 1000 hours.

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