• Title/Summary/Keyword: X-element

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Control of $NaAlSiO_4:Eu^{2+}$ photoluminescence properties by charge-compensated aliovalent element substitutions

  • Kim, Jihae;Kato, Hideki;Kakihana, Masato
    • Journal of Information Display
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    • v.13 no.3
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    • pp.97-100
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    • 2012
  • We have conducted two kinds of the so-called charge-compensated aliovalent element substitutions to control the photoluminescence properties of $NaAlSiO_4:Eu^{2+}$ with a special focus on the enhancement of the excitation intensity at 400 nm. The aliovalent element substitutions include cation-cation and cation-anion co-substitutions according to the general formulas $Na_{1-x}M_xAl_{1+x}Si_{1-x}O_4:Eu^{2+}$ and $Na_{1-x}M_xAlSiO_{4-x}N_x:Eu^{2+}$ (M = $Mg^{2+}$, $Ca^{2+}$, and $Sr^{2+}$), respectively. The increase in the relative excitation intensity at 400 nm has been achieved in both types of the co-substitutions. Thus, the present research has demonstrated the effectiveness of the charge-compensated element substitution.

ON g(x)-INVO CLEAN RINGS

  • El Maalmi, Mourad;Mouanis, Hakima
    • Communications of the Korean Mathematical Society
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    • v.35 no.2
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    • pp.455-468
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    • 2020
  • An element in a ring R with identity is called invo-clean if it is the sum of an idempotent and an involution and R is called invoclean if every element of R is invo-clean. Let C(R) be the center of a ring R and g(x) be a fixed polynomial in C(R)[x]. We introduce the new notion of g(x)-invo clean. R is called g(x)-invo if every element in R is a sum of an involution and a root of g(x). In this paper, we investigate many properties and examples of g(x)-invo clean rings. Moreover, we characterize invo-clean as g(x)-invo clean rings where g(x) = (x-a)(x-b), a, b ∈ C(R) and b - a ∈ Inv(R). Finally, some classes of g(x)-invo clean rings are discussed.

SOME EXAMPLES OF WEAKLY FACTORIAL RINGS

  • Chang, Gyu Whan
    • Korean Journal of Mathematics
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    • v.21 no.3
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    • pp.319-323
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    • 2013
  • Let D be a principal ideal domain, X be an indeterminate over D, D[X] be the polynomial ring over D, and $R_n=D[X]/(X^n)$ for an integer $n{\geq}1$. Clearly, $R_n$ is a commutative Noetherian ring with identity, and hence each nonzero nonunit of $R_n$ can be written as a finite product of irreducible elements. In this paper, we show that every irreducible element of $R_n$ is a primary element, and thus every nonunit element of $R_n$ can be written as a finite product of primary elements.

Kaplansky-type Theorems, II

  • Chang, Gyu-Whan;Kim, Hwan-Koo
    • Kyungpook Mathematical Journal
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    • v.51 no.3
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    • pp.339-344
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    • 2011
  • Let D be an integral domain with quotient field K, X be an indeterminate over D, and D[X] be the polynomial ring over D. A prime ideal Q of D[X] is called an upper to zero in D[X] if Q = fK[X] ${\cap}$ D[X] for some f ${\in}$ D[X]. In this paper, we study integral domains D such that every upper to zero in D[X] contains a prime element (resp., a primary element, a t-invertible primary ideal, an invertible primary ideal).

Interfacial diffusion in Fe/Cr magnetic multilayers studied by synchrotron x-ray techniques (다층형 Fe/Cr 자성박막에서 계면확산의 방사광 x-선 연구)

  • Cho, Tae-Sik;Jeong, Ji-Wook
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05a
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    • pp.84-87
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    • 2003
  • The interfacial diffusion in Fe/Cr/MgO(001) multilayers has been studied using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and anomalous x-ray scattering (AXS). The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers with Cr-$4{\AA}$-thick was larger than that with Cr-$4{\AA}$-thick. The results of EXAFS indicated that the Fe element dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The AXS was certified the existence of the interdiffused Fe element in the Cr layers. Our study revealed that the rough interface of the Fe/Cr multilayers was caused by the interfacia diffusion of Fe element into the Cr layers.

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The Effect of Additional Elements X on Magnetic Properties of CoCrTa/Cr-X Thin Film (CoCrTa/Cr-X 자성박막의 자기적성질에 미치는 첨가원소 X의 영향)

  • 김준학;박정용;남인탁;홍양기
    • Journal of the Korean Magnetics Society
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    • v.3 no.4
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    • pp.314-319
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    • 1993
  • The Effects of additional element X (X = Si, Mo, Cu, Gd) on magnetic properties and microstructure of Co-1Zat%Cr-Zat%Ta/Cr-X magnetic thin film were investigated. The thickness changes of Cr-X underlayer and CoCrTa magnetic layer were in the range of $1000~2000\AA$ and $200~800\AA$. respectively. Substrate temperatures were controlled from $100^{\circ}C$ to $200^{\circ}C$. Increase of coercivity by about 100~200 Oe was observed in CoCrTa/Cr-X thin films compared to those without additional X element. Cu was the most effective additional element for increasing coercivity. CoCrTa/Cr-Cu thin film shows relatively high coercivity in $1500\AA$ underlayer thickness and $600\AA$ magnetic layer thickness.

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Evaluation of Strength and Residual Stress in $Si_3N_4/SUS304$ Joint ($Si_3N_4/SUS304$ 접합재의 잔류응력 및 강도평가)

  • 박영철;오세욱;조용배
    • Transactions of the Korean Society of Mechanical Engineers
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    • v.18 no.1
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    • pp.101-112
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    • 1994
  • The measurement of residual stress distribution of $Si_3N_4/SUS304$ joint was performed on 23 specimens with the same joint condition using PSPC type X-ray stress measurement system and the two-dimensional elastoplastic analysis using finite element method was also attempted. As results, residual stress distribution near the interface on the ceramic side of the joint was revealed quantitatively. Residual stress on the ceramic side of the joint was turned out to be tensional near the interface, maximum along the edge, varying in accordance with the condition of the joint and variance to be most conspicuous for the residual stress normal to the interface characterized by the stress singularities. In the vicinity of the interface, the high stress concentration occurs and residual stress distributes three-dimensionally. Therefore, the measured stress distribution differed remarkably from the result of the two-dimensional finite-element analysis. Especially at the center of the specimen near the interface, the residual stress, $\sigma_{x}$ obtained from the finite element analysis was compressive, whereas measurement using X-ray yielded tensile $\sigma_{x}$. Here we discuss two dimensional superposition model the discrepancy between the results from the two dimensional finite element analysis and X-ray measurement.

THE STRUCTURE OF ALMOST REGULAR SEMIGROUPS

  • Chae, Younki;Lim, Yongdo
    • Bulletin of the Korean Mathematical Society
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    • v.31 no.2
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    • pp.187-192
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    • 1994
  • The author extended the small properties of topological semilattices to that of regular semigroups [3]. In this paper, it could be shown that a semigroup S is almost regular if and only if over bar RL = over bar R.cap.L for every right ideal R and every left ideal L of S. Moreover, it has shown that the Bohr compactification of an almost regular semigroup is regular. Throughout, a semigroup will mean a topological semigroup which is a Hausdorff space together with a continuous associative multiplication. For a semigroup S, we denote E(S) by the set of all idempotents of S. An element x of a semigroup S is called regular if and only if x .mem. xSx. A semigroup S is termed regular if every element of S is regular. If x .mem. S is regular, then there exists an element y .mem S such that x xyx and y = yxy (y is called an inverse of x) If y is an inverse of x, then xy and yx are both idempotents but are not always equal. A semigroup S is termed recurrent( or almost pointwise periodic) at x .mem. S if and only if for any open set U about x, there is an integer p > 1 such that x$^{p}$ .mem.U.S is said to be recurrent (or almost periodic) if and only if S is recurrent at every x .mem. S. It is known that if x .mem. S is recurrent and .GAMMA.(x)=over bar {x,x$^{2}$,..,} is compact, then .GAMMA.(x) is a subgroup of S and hence x is a regular element of S.

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Design of Soft X-ray Tube and Simulation of Electron Beam by Using an Electromagnetic Finite Element Method for Elimination of Static Electric Field (전자기 유한요소법 전자빔 시뮬레이션을 이용한 정전기장 제거용 연한 X-선관 설계 특성 연구)

  • Park, Tae-Young;Lee, Sang-Suk;Park, Rae-Jun
    • Journal of the Korean Magnetics Society
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    • v.24 no.2
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    • pp.66-69
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    • 2014
  • The spreading tube of X-ray cathode tube displayed with an electromagnetic finite element method was designed. To analyze a feature design and the concrete coordinate performance of soft X-ray tube modeling, the orbit of electron beam was simulated by OPERA-3D SW program. The fixed conditions were the applied voltage, the temperature, the work function of thermal electron between cathode and anode of tungsten. Through the analysis of distribution of electron beam and the variation of dividing region, the design of soft X-ray spreading tube equipped with two cross filaments was optimized.

Multi-material topology optimization for crack problems based on eXtended isogeometric analysis

  • Banh, Thanh T.;Lee, Jaehong;Kang, Joowon;Lee, Dongkyu
    • Steel and Composite Structures
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    • v.37 no.6
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    • pp.663-678
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    • 2020
  • This paper proposes a novel topology optimization method generating multiple materials for external linear plane crack structures based on the combination of IsoGeometric Analysis (IGA) and eXtended Finite Element Method (X-FEM). A so-called eXtended IsoGeometric Analysis (X-IGA) is derived for a mechanical description of a strong discontinuity state's continuous boundaries through the inherited special properties of X-FEM. In X-IGA, control points and patches play the same role with nodes and sub-domains in the finite element method. While being similar to X-FEM, enrichment functions are added to finite element approximation without any mesh generation. The geometry of structures based on basic functions of Non-Uniform Rational B-Splines (NURBS) provides accurate and reliable results. Moreover, the basis function to define the geometry becomes a systematic p-refinement to control the field approximation order without altering the geometry or its parameterization. The accuracy of analytical solutions of X-IGA for the crack problem, which is superior to a conventional X-FEM, guarantees the reliability of the optimal multi-material retrofitting against external cracks through using topology optimization. Topology optimization is applied to the minimal compliance design of two-dimensional plane linear cracked structures retrofitted by multiple distinct materials to prevent the propagation of the present crack pattern. The alternating active-phase algorithm with optimality criteria-based algorithms is employed to update design variables of element densities. Numerical results under different lengths, positions, and angles of given cracks verify the proposed method's efficiency and feasibility in using X-IGA compared to a conventional X-FEM.