• 한국세라믹학회지
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• 제28권5호
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• pp.383-389
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• 1991

The analysis of degradation phenomena of poled PZT ceramics was investigated relate to piezoelectric equivalent circuit elements. As a result, in the case of impressed mechanical shock on poled specimen of degradation phenomena was explained by domain rearrangement, and in the case of left in air, degradation phenomena was explained by space charge diffusion.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.857-860
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• 2000

The objective of this paper is to demonstrate degradation phenomena through DC degradation tests and predicts degradation phenomena as a function of time from the tests. The ZnO varistor used in this investigation were fabricated by standard ceramic techniques. Especial, these were sintered in nitrogen atmosphere, at 2 h, for $1300^{\circ}C$. The conditions of DC degradation test were 115$\pm$$2^{\circ}C$for 0, 2, 4, and 8 h, respectively. To demonstrate the degradation phenomena of ZnO varistors, Voltagecurrent analyses were performed before and after the degradation test, and frequency analyses were used with the time of the degradation tests. It was found that the degradation occurred in not grain but grain boundary and the degradation behavior of varistors was unsymmetrically degraded with the direction of tests.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 기술교육위원회 창립총회 및 학술대회 의료기기전시회
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• pp.47-51
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• 2001

The electrical degradation phenomena of epoxy composites to be used as a molding material for transformers were studied. The electrets were first manufactured by applying high voltages to five kinds of specimens given a mixing rate, and then TSC(Thermally Stimulated Current) values at the temperature range of $-160\sim200[^{\circ}C]$ were measured from a series of experiments. The behaviour of carrier and its origin in epoxy composites were examined, respectively, And various effects of electrical degradation on epoxy composites were also discussed in this study.

• Structural Engineering and Mechanics
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• 제9권6호
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• pp.601-613
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• 2000

Existing models for the shear strength degradation of reinforced concrete members present varied conceptual approaches to interpreting test data. The relative superiority of one approach over the others is difficult to determine, particularly given the sparseness of ideal test data. Nevertheless, existing models are compared using a suite of test data that were used for the development of one such model, and significant differences emerge. Rather than relying purely on column test data, the body of knowledge concerning degradation of concrete as a material is considered. Confined concrete relations are examined to infer details of the degradation process, and to establish a framework for developing phenomenologically-based models for shear strength degradation in reinforced concrete members. The possibility of linking column shear strength degradation with material degradation phenomena is explored with a simple model. The model is applied to the results of 7 column tests, and it is found that such a link is sustainable. It is expected that models founded on material degradation phenomena will be more reliable and more broadly applicable than the current generation of empirical shear strength degradation models.

• 대한전기학회논문지
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• 제43권7호
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• pp.1121-1127
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• 1994

The accelerated degradation phenomena in amorphous silicon thin film transistors due to both electrical stress and visible light illumination under the elevated temperature have been investigated systematically as a function of gate bias, light intensity, and stress time. It has been found that, in case of electrical stress, the thrshold voltage shifts of a-Si:H TFT's may be attributed to the defect creation process at the early stage, while the charge trapping phenomena may be dominant when the stressing periods exceed about 2 hours. It has been also observed that the degradation in the device characteristics of a-Si:H TFT's is accelerated due to multiple stress effects, where the defect creation mechanism may be more responsible for the degradation rather than the charge trapping mechanism.

• 대한전자공학회논문지SD
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• 제40권10호
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• pp.32-38
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• 2003

SIMOX 웨이퍼를 사용하여 제작된 GAA 구조 SOI MOSFET의 열전자에 의한 소자열화를 측정·분석하였다. nMOSFET의 열화는 스트레스 게이트 전압이 문턱전압과 같을 때 최대가 되었는데 이는 낮은 게이트 전압에서 PBT 작용의 활성화로 충격이온화가 많이 되었기 때문이다. 소자의 열화는 충격이혼화로 생성된 열전자와 홀에의한 계면상태 생성이 주된 원인임을 degradation rate와 dynamic transconductance 측정으로부터 확인하였다. 그리고 pMOSFET의 열화의 원인은 DAHC 현상에서 생성된 열전자 주입에 의한 전자 트랩핑이 주된 것임을 스트레스 게이트 전압변화에 따른 드레인 전류 변화로부터 확인 할 수 있었다.

• 한국재료학회지
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• 제4권4호
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• pp.439-444
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• 1994

분극처리된 PZT세라믹스에 외부응력을 인가하였을때 인가되는 응력의 방향에 따른 열화기구의 차이를 조사하였다. 그 결과 분극축과 수직으로 응력을 인가할때의 열화현상은 공간전하분극의 확산으로, 분극축과 평행하게 응력을 인가할때는 분역재배열현상으로 설명하였다. 소결체의 입자 크기가 커지면 열화폭이 커짐을 알 수 있었는데 이것은 입자크기에 따른 내부응력의 차이로 해석하였다.

• 한국컴퓨터정보학회:학술대회논문집
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• 한국컴퓨터정보학회 2011년도 제44차 하계학술발표논문집 19권2호
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• pp.351-354
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• 2011

The electrical degradation phenomena of epoxy composites to be used as a molding material for transformers were studied. The electrets were first manufactured by applying high voltages to five kinds of specimens given a mixing rate, and then TSC(Thermally Stimulated Current) values at the temperature range of $-160{\sim}200[^{\circ}C]$ were measured from a series of experiments. The behaviour of carrier and its origin in epoxy composites were examined, respectively. And various effects of electrical degradation on epoxy composites were also discussed in this study.

• 한국지진공학회:학술대회논문집
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• 한국지진공학회 2001년도 춘계학술대회 논문집
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• pp.353-360
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• 2001

An analysis procedure of 2-dimensional bridge dynamics has been developed by using force-deformation model, which simulates the pier motion under biaxial bending due to the bi-directional input seismic excitations. A three-dimensional mechanical model is utilized, which can consider the other major phenomena such as pounding, rotation of the superstructure, abutment stiffness degradation, and motions of the foundation motions. The bi-directional dynamic behaviors of the bridge are then examined by investigating the relative displacements of each oscillator to the ground. It is found that the nonlinearity of the pier due to biaxial bending affects the pier motions, but the global bridge behaviors are greatly governed by the pounding phenomena and stiffness degradation of the abutment-backfill system. Especially, the relative displacement of the abutment system (A2) with movable supports to the ground is increased about 30% due to the abutment stiffness degradation.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제50권4호
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• pp.153-160
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• 2001

In order to analyze the degradation process of epoxy/glass fiber for outdoor condition, FRP laminate was exposed to high temperature. Then, the degradation process was evaluated by comparing contact angle, surface potential, surface resistivity, and XPS. The experimental results showed that the amount of weight loss, contact angle, surface potential and surface resistivity increased up to 200 $^{\circ}C$ as a function of temperature. These phenomena show the existence of hydrophobic surface. With the change to the hydrophobic surface and the electrical potential and resistivity on FRP surface increased. In XPS to analyze surface chemical structures, the increased hydrophobicity in thermal increase of unsaturated double bond in carbon chains. Aslo, thermal treatment caused the discoloration on the point of treated surface. These phenomena were attributed to the generations of ether group.