• JSTS:Journal of Semiconductor Technology and Science
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• v.13 no.1
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• pp.71-78
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• 2013

In highly reliable and durable systems, failures due to aging might result in catastrophes. Aging monitoring techniques to prevent catastrophes by predicting such a failure are required. Aging can be monitored by performing a delay test at faster clocks than functional clock in field and checking the current delay state from the test clock frequencies at which the delay test is passed or failed. In this paper, we focus on test clock control scheme for a system-on-chip (SoC) with multiple clock domains. We describe limitations of existing at-speed test clock control methods and present an on-chip faster-than-at-speed test clock control scheme for intra/inter-clock domain test. Experimental results show our simulation results and area analysis. With a simple control scheme, with low area overhead, and without any modification of scan architecture, the proposed method enables faster-than-at-speed test of SoCs with multiple clock domains.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.4
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• pp.643-653
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• 2012

In this paper, we consider a clock tree synthesis technique (CTS) based on buffer insertion method in the multiple clock domain. We propose some detail techniques about the preparing items and the practical method for implementing CTS. We also propose a post processing after CTS implementation. Until now, the buffer insertion-based CTS technique has been widely used, and this paper discusses especially it's practical technique to be applied in the commercial fields to develop ASIC and SoC. CTS is very dependent on the used tool. We use Astro of Synopsys and propose the empirical and theoretical information of the detail techniques for implementing CTS using this tool. We expect that the proposed technique becomes to be good guidelines to backend designers.