• 한국정보통신학회논문지
• /
• 제15권6호
• /
• pp.1397-1403
• /
• 2011

본 논문에서는 W-Band(75 GHz~110 GHz) 주파수 대역에서 전파특성 분석을 위한 샘플홀더 제작을 위하여 수행되었다. 먼저 도파관 내에서 전파의 전파이론을 정립하고 재료정수 측정기법을 도출하였다. 그리고 밀리미터파 W-band에 알맞은 도파관형 샘플홀더를 설계 및 제작하고 RAM 샘플을 이용하여 재료정수 및 전파흡수능을 측정하여 분석하였다. 분석결과 샘플시료 특성을 정확하게 측정할 수 있음을 확인하였으며, 향후 이 측정 샘플홀더는 W-band 대역 전파특성 분석을 위해 매우 유용하게 쓰일 수 있을 것이다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
• /
• pp.298-299
• /
• 2005

Differently from the tensile, transverse compression and torsion cases, the bending test of HTS tapes requires a lot of time and efforts, since the sample should be mounted successively onto bent sample holders in the order of decreasing radius and measuring the $I_c$ at each step. The influence of repeated cooling and warming experienced during these processes on the $I_c$ degradation can not be ignored. As a result, in this study, particularly. a new one-body type sample holder which provides continuous bending strains at 77K was devised. And, $I_c$ degradation behavior of Bi-2223 tapes under easy bending condition was investigated and compared that with other cases using Goldacker-type bending tester or respective sample holder.

• 한국정밀공학회:학술대회논문집
• /
• 한국정밀공학회 2001년도 춘계학술대회 논문집
• /
• pp.938-941
• /
• 2001

A tool holder system has been designed and builted to measure cutting forces in diamond turning. This system design includes a 3-component piezo-electric tranducer. Initial experiments with tool holder system included verification of its predicted dynamic characteristics as well as a detailed study of cutting parameters. In this research, tool holder system is modeled by considering the element dividing, material properties, and boundary conditions using MSC/PATRAN. Mode and frequency analysis of structure is simulated by MSC/NASTRAN, for the purpose of developing the effective design. In addition, tool holder system is verified by vibration test using accelerometer. Many cutting experiments have been conducted on 6061-T6 aluminum. Tests have involved investigation of velocity effects, and the effects of depth and feedrate on tool force. Cutting velocity has been determined to have negligible effects between 4 and 21㎧.(6) Forces generally increase with increasing depth of cut. Increasing feedrate does not necessarily lead to higher forces. Results suggest that a sample model may not be sufficient to describe the forces produced in the diamond turning process.

• 한국안광학회지
• /
• 제20권2호
• /
• pp.105-115
• /
• 2015

목적: 본 연구는 안경렌즈홀더와 콘택트렌즈홀더를 사용하여 다양한 디옵터와 함수율을 가진 소프트 콘택트렌즈의 굴절력을 측정하고 정확도를 평가하여 그 차이를 비교하였다. 방법: 실험에 사용한 소프트 콘택트렌즈의 함수율은 각각 38%, 43% 및 58%이었으며, 굴절력에 따라 -3.000 D, -7.000 D 및 -10.000 D로 분류하여 각각 실험하였다. 또한 망원경식 렌즈미터를 사용하여 안경렌즈홀더 및 콘택트렌즈홀더로 각각의 정점굴절력을 측정하여 정확도를 분석하였다. 결과: 안경렌즈홀더를 사용한 경우 -3.0000 D는 -3.3273 D로 측정되었으며, -7.0000 D는 -7.1306 D, -10.0000 D는 -10.2944D로 각각 측정되었다. 또한 콘택트렌즈홀더를 사용한 경우 -3.0000 D는 -3.1060 D로 측정되었으며, -7.0000 D는 -7.0028 D, -10.0000 D는 -10.2611 D로 각각 측정되었다. 모든 종류의 콘택트렌즈에서 콘택트렌즈홀더를 사용한 방법이 안경렌즈홀더를 사용한 방법보다 더 정확한 측정값을 나타내었다. 결론: 위 결과로 볼 때, 망원경식 렌즈미터를 사용한 소프트 콘택트렌즈의 굴절력 측정에 있어 콘택트렌즈홀더를 사용한 방법이 안경렌즈홀더를 사용한 방법보다 더 높은 정확도를 가진 것으로 판단된다.

• 한국통신학회논문지
• /
• 제36권5A호
• /
• pp.441-449
• /
• 2011

Orthogonal frequency division multiplexing (OFDM) 환경에서 sample timing offset(STO)과 carrier frequency offset(CFO)은 inter-symbol interference (ISI), inter-carrier interference (ICI) and phase error를 발생 시키는 원인으로 작용하고 있다. OFDM의 특성상 STO와 CFO에 민감하고, 특히 ICI 가 발생될 경우 보상이 어렵다. 또한 보상을 위해 많은 복잡도를 가진 equalizer가 요구된다. 이 논문에서는 블록 파일럿과 동기화 신호를 가지고, feedback방법을 이용해 STO와 CFO의 효과적인 정정 방법을 제시한다. 주파수 축에서 동기화 신호와 pilot을 이용해 추정한 값들을 시간 축으로 피드백 시킨 후, 시간 영역에서 sample & holder의 시간 타이밍과 oscillator의 주파수의 교정을 통해 정정한다. 시뮬레이션 결과 보상기 없이 피드백 구조만으로 STO와 CFO를 보상하여 성능을 개선 시켰다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2002년도 춘계학술대회 논문집 센서 박막재료 반도체재료 기술교육
• /
• pp.98-102
• /
• 2002

We investigated domains and conoscope under the polarizing microscope and the index of refraction on the c-plate GMO which has the ferroelectric and ferroelastic phase at room temperature. To observed the change of refractive index in connection with domain, we developed an apparatus to obtain the refractive index by measuring the Brewster's angle. The resolution of the minimum rotation angle of this apparatus is $0.001^{\circ}$. To obtain the refractive index map on the sample, the moving distance of XY stage loaded sample holder is 60 mm and the minimum moving distance is 0.002 mm. Also, To obtain the indicatrix for single crystal, vertical turntable with sample holder and XY stage was loading on horizontal turntable. The minimum resolution angle of this vertical turntable is $0.001^{\circ}$. We measured the refractive index of transparent materials such as ferroelectrics. In the case of $Gd_{2}(MoO_{4})_{3}$, the Brewster angle is $62.11^{\circ}$ and then, the refractive index is 1.8895 by using He-Ne Laser. Also the refractive distribution of c-plate GMO was obtained with $400{\mu}m{\times}120{\mu}m$.

• Current Photovoltaic Research
• /
• 제5권3호
• /
• pp.89-94
• /
• 2017

We have examined the issues on the measurement of bifacial photovoltaic(PV) devices that should be considered in order to ensure a measurement accuracy beyond a certain level and the comparability between the bifacial PV devices. Based on the results of various experiments and previous studies, solutions for these measurement issues are suggested. The most significant technical issues in the performance measurement of the bifacial PV devices are 1) elimination of the effect due to the light reflection on the sample holder surface and 2) the measurement of the expected power generation gain in outdoor operation. The effect due to the light reflection on the sample holder surface can be eliminated by using an anti-reflective sample holder. In case of a reflective sample holder, if the bifacial device have a linear characteristic with respect to the irradiance of incident light, it has been confirmed (through some previous studies and additional experiment) that exact measurement results can be obtained by the correction of the measurement data. In addition, it was also confirmed that the expected power generation gain in the outdoor operation can be obtained by three different methods along with the basic concepts of the bifaciality coefficient, the albedo, and the effective front irradiance.

• 한국초전도ㆍ저온공학회논문지
• /
• 제7권4호
• /
• pp.4-9
• /
• 2005

The degradation behavior of the critical current $(I_c)$ of Bi-2223 superconducting tapes under pressurized liquid nitrogen were investigated using a newly developed p-shaped sample holder which gives a series of bending strains to a sample. Three kinds of commercially available multi-filamentary Bi-2223 superconducting tapes were used. At atmospheric pressure, the Ie degradation behavior depended on the manufacturing process undergone by each tape. The tapes externally reinforced or densified by over pressure showed better bending strain tolerance than the Ag alloy-sheathed Bi-2223 tape. But these tapes showed a significant $I_c$ degradation when pressurized to 1 MPa in liquid nitrogen. For all samples, after depressurization to atmospheric pressure from 1 MPa, the Ie was completely recovered to its initial values at atmospheric pressure. When the samples were subjected to a thermal cycle wherein the tape was warmed up to room temperature after being depressurized from 1 MPa, it was found that the larger degradation of $I_c$ occurred at the regions where significant ballooning occurred, such as $0\%\;and\;0.2\%$. However, an improved ballooning damage tolerance was observed in the highly-densified tape.

• 한국전자현미경학회:학술대회논문집
• /
• 한국현미경학회 2001년도 제32차 추계학술대회
• /
• pp.18-22
• /
• 2001

A technique to characterize specific site of materials using a combination of a dedicated focused ion beam system(FIB), and Intermediate-voltage scanning transmission electron microscope(STEM) or transmission electron microscope(TEM) equipped with a scanning electron microscope(SEM) unit has been developed. The FIB system is used for preparation of electron transparent thin samples, while STEM or TEM is used for localization of a specific site to be milled in the FIB system. An FIB-STEM(TEM) compatible sample holder has been developed to facilitate thin sample preparation with high positional accuracy Positional accuracy of $0.1{\mu}m$ or better can be achieved by the technique. In addition, an FIB micro-sampling technique has been developed to extract a small sample directly from a bulk sample in a FIB system These newly developed techniques were applied for the analysis of specific failure in Si devices and also for characterization of a specific precipitate In a metal sample.

• 한국CDE학회논문집
• /
• 제10권5호
• /
• pp.365-374
• /
• 2005

Most of people who are engaged in research and development find it difficult to solve the engineering problems creatively due to the lack of ideas. TRIZ is one of the emerging problem solving techniques that leads us to a very useful and clear solution. TRIZ consists of several tools such as ideal final result (IFR), physical and technical contradictions, 40 invention principles, resource, effect, etc. However, many designers think that TRIZ is hard to be applied to a design problem since there are several tools in TRIZ. Machine designers may want to see which tool is more effective than others. Thus, this paper provides sample solutions of a design problem: holder design for the bottle etching machine by applying several TRIZ tools. Difficulties in applying TRIZ to a design problem are discussed.