• Journal of the Institute of Electronics Engineers of Korea SD
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• v.40 no.7
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• pp.474-480
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• 2003

We designed and tested a new scan driver output stage. Compared to conventional CMOS structured scan driver IC′s, the new NMOSFET-only scan driver circuit can reduce the chip area and therefore, the chip cost considerably. We confirmed the circuit operation with open drain power NMOSFET IC′s by driving 2"PDP test panel. We defined critical device parameters and their optimization methods lot the best circuit performance.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.11
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• pp.115-121
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• 2004

GenJTAG implemented in this paper is an automatic web-based boundary scan circuit generator. GenJTAG supports all the public instructions for the boundary scan technique, and also private instructions for other DFT techniques to be applied. Users can easily edit the generated boundary scan circuit code because it is described in behavioral level with the Verilog-HDL. GenJTAG has another advantage that any one can generate the boundary scan circuit by simply accessing to the web site.

• 한국정보디스플레이학회:학술대회논문집
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• 2000.01a
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• pp.183-184
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• 2000

A new driving circuit for scan electrode in AC PDP has been developed. The number of scan driver switches can be reduced to one half of the conventional circuit. Capacitance between the electrodes is utilized. Experiments and analysis of the new structure has been carried out to confirm its robustness.

• Proceedings of the IEEK Conference
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• 2001.06b
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• pp.125-128
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• 2001

In this paper, we propose a low power Scan-based Built-ln Self Test based on circuit partitioning and pattern suppression using modified test control unit. To partition a CUT(Circuit Under Testing), the MHPA(Multilevel Hypergraph Partition Algorithm) is used. As a result of circuit partition, we can reduce the total length of test pattern, so that power consumptions are decreased in test mode. Also, proposed Scan-based BIST architecture suppresses a redundant test pattern by inserting an additional decoder in BIST control unit. A decoder detects test pattern with high fault coverage, and applies it to partitioned circuits. Experimental result on the ISCAS benchmark circuits shows the efficiency of proposed low power BIST architecture.

• Journal of Electrical Engineering and Technology
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• v.3 no.1
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• pp.130-134
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• 2008

The increasing size of very large scale integration (VLSI) circuits, high transistor density, and popularity of low-power circuit and system design are making the minimization of power dissipation an important issue in VLSI design. Test Power dissipation is exceedingly high in scan based environments wherein scan chain transitions during the shift of test data further reflect into significant levels of circuit switching unnecessarily. Scan chain or cell modification lead to reduced dissipations of power. The ETC algorithm of previous work has weak points. Taking all of this into account, we therefore propose a new algorithm. Its name is RE_ETC. The proposed modifications in the scan chain consist of Exclusive-OR gate insertion and scan cell reordering, leading to significant power reductions with absolutely no area or performance penalty whatsoever. Experimental results confirm the considerable reductions in scan chain transitions. We show that modified scan cell has the improvement of test efficiency and power dissipations.

• Journal of Electrical Engineering and information Science
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• v.2 no.3
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• pp.7-13
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• 1997

To overcome the large hardware overhead attendant in the full scan design, the concept of partial scan design has emerged with the virtue of less area and testability close to full scan. Combinational Structure has been developed to avoid the use of sequential test generator. But the patterns sifted on scan register have to be held for sequential depth period upon the aid of the dedicated HOLD circuit. In this paper, a new levelized structure is introduced aiming to exclude the need of extra HOLD circuit. The time to stimulate each scan latch is uniquely determined on this structure, hence each test pattern can e applied by scan shifting and then pulsing a system clock like the full scan but with much les scan flip-flops. Experimental results show that some sequential circuits are levelized by just scanning self-loop flip-flops.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.5
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• pp.980-986
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• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• Proceedings of the KIEE Conference
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• 1987.07b
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• pp.1492-1494
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• 1987

This paper describes a hardware architecture called Edge Painting Machine for real time generation of scan line images for raster scan graphics display. The Edge Painting Machine consists of Scanline Processor which converts polygon data sorted in their depth priority into a set of scan line commands for each scan line, and Edge Painting Tree which converts the scanline commands set into a raster line image. Edge painting tree has been designed using combinational logic circuit. The designed circuit has been simulated to verify the proper functioning. A salient feature of the EPT is that hardware composition is simple, because each processor is constituted by only combinational logic circuit.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.19 no.8
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• pp.13-18
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• 2005

The variation of discharge characteristics of an ac PDP was observed with the charge of scan electrode driving circuit. Conventional scan electrode driving circuit provides two switches per one scan line, and the suggested one can be constituted by one switch per one scan line with the consideration of capacitive load characteristic of an ac PDP. To verify the workability of the suggested scheme, the performances of the ac PDP was investigated. The dynamic voltage margin was slightly decreased with the adoption of the suggested scheme, which is estimated to result from the misfiring of unselected discharge cells due to the deformation of voltage level of the neighboring scan electrode. In the observation of the delay characteristics of addressing discharge, the performances of the conventional circuit and the suggested one are assumed to be equivalent.

• Journal of Korea Multimedia Society
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• v.4 no.6
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• pp.570-578
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• 2001

Boundary scan architecture test methodology was introduced to facilitate the testing of complex printed circuit board. The boundary scan architecture has a tremendous potential for real time monitoring of the operational status of a system without interference of normal system operation. In this paper, a new type of embedded controller for real time monitoring of the operational status of a system is proposed and designed by using boundary scan architecture. The proposed real time monitoring embedded controller consists of test access port controller and an embedded controller proposed real time monitoring embedded controller using boundary scan architecture can save the hard-wire resource and can easily interface with boundary scan architecture chip. Experimental results show that the real time monitoring using proposed embedded controller is more effective then the real time monitoring using host computer.