• 제목/요약/키워드: statistical process control

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지역적이고 비정규분포를 갖는 데이터의 공정관리를 위한 지역기반 T2관리도 (Local T2 Control Charts for Process Control in Local Structure and Abnormal Distribution Data)

  • 김정훈;김성범
    • 품질경영학회지
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    • 제40권3호
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    • pp.337-346
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    • 2012
  • Purpose: A Control chart is one of the important statistical process control tools that can improve processes by reducing variability and defects. Methods: In the present study, we propose the local $T^2$ multivariate control chart that can efficiently detect abnormal observations by considering the local pattern of the in-control observations. Results: A simulation study has been conducted to examine the property of the proposed control chart and compare it with existing multivariate control charts. Conclusion: The results demonstrate the usefulness and effectiveness of the proposed control chart.

가변샘플링기법을 이용한 합성관리도의 개발 (Development of VSI Synthetic Control Chart)

  • 송서일;박현규
    • 품질경영학회지
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    • 제33권1호
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    • pp.1-10
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    • 2005
  • This paper develops a new VSI $\={X}-CRL$ synthetic control chart that considers convenience of use in the field, and perception of change of process applying VSI techniques to synthetic control chart, simultaneously. We found the optimal sampling interval and various control limit factor of the suggested chart using markov chain. Comparison and analysis is carried out between synthetic VSI $\={X}-CRL$ chart and other chart in the statistical aspect; $\={X}$ control chart, VSI $\={X}$ chart, another synthetic chart. In case that the process follows normal distribution, the proposed VSI $\={X}-CRL$ synthetic control chart in detecting process mean shift showed the best performance in aspect of statistical performance, regardless of control limit L of CRL/S control chart.

소표본 자기상관 자료의 분산 추정을 위한 최적 부분군 크기에 대한 연구 (To study of optimal subgroup size for estimating variance on autocorrelated small samples)

  • 이종선;이재준;배순희
    • 한국품질경영학회:학술대회논문집
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    • 한국품질경영학회 2007년도 춘계학술대회
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    • pp.302-309
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    • 2007
  • To conduct statistical process control needs the assumption that the process data are independent. However, most of chemical processes, like a semi-conduct processes do not satisfy the assumption because of autocorrelation. It causes abnormal out of control signal in the process control and misleading process capability. In this study, we introduce that Shore's method to solve the problem and to find the optimal subgroup size to estimate variance for AR(l) model. Especially, we focus on finding an actual subgroup size for small samples using simulation. It may be very useful for statistical process control to analyze process capability and to make a Shewhart chart properly.

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통계적 분석기법을 이용한 공정 운전 향상의 방법 (Process operation improvement methodology based on statistical data analysis)

  • Hwang, Dae-Hee;Ahn, Tae-Jin;Han, Chonghun
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 1997년도 한국자동제어학술회의논문집; 한국전력공사 서울연수원; 17-18 Oct. 1997
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    • pp.1516-1519
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    • 1997
  • With disseminationof Distributed Control Systems(DCS), the huge amounts of process operation data could have been available and led to figure out process behaviors better on the statistical basis. Until now, the statistical modeling technology has been susally applied to process monitoring and fault diagnosis. however, it has been also thought that these process information, extracted from statistical analysis, might serve a great opportunity for process operation improvements and process improvements. This paper proposed a general methodolgy for process operation improvements including data analysis, backing up the result of analysis based on the methodology, and the mapping physical physical phenomena to the Principal Components(PC) which is the most distinguished feature in the methodology form traditional statistical analyses. The application of the proposed methodology to the Balst Furnace(BF) process has been presented for details. The BF process is one of the complicated processes, due to the highly nonlinear and correlated behaviors, and so the analysis for the process based on the mathematical modeling has been very difficult. So the statisitical analysis has come forward as a alternative way for the useful analysis. Using the proposed methodology, we could interpret the complicated process, the BF, better than any other mathematical methods and find the direction for process operation improvement. The direction of process operationimprovement, in the BF case, is to increase the fludization and the permeability, while decreasing the effect of tapping operation. These guide directions, with those physical meanings, could save fuel cost and process operator's pressure for proper actions, the better set point changes, in addition to the assistance with the better knowledge of the process. Open to set point change, the BF has a variety of steady state modes. In usual almost chemical processes are under the same situation with the BF in the point of multimode steady states. The proposed methodology focused on the application to the multimode steady state process such as the BF, consequently can be applied to any chemical processes set point changing whether operator intervened or not.

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관리도 성능평가모형을 통한 관리한계선 갱신주기 탐지기법 (Update Cycle Detection Method of Control Limits using Control Chart Performance Evaluation Model)

  • 김종우;박정술;김준석;김성식;백준걸
    • 대한산업공학회지
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    • 제40권1호
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    • pp.43-51
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    • 2014
  • Statistical process control (SPC) is an important technique for monitoring and managing the manufacturing process. In spite of its easiness and effectiveness, some problematic sides of application exist such that the SPC techniques are hardly reflect the changes of the process conditions. Especially, update of control limits at the right time plays an important role in acquiring a reasonable performance of control charts. Therefore, we propose the control chart performance evaluation index (CPEI) based on count data model to monitor and manage the performance of control charts. The CPEI could indicate the degree of control chart performance and be helpful to detect the proper update cycle of control limits in real time. Experiments using real manufacturing data show that the proper update intervals are made by proposed method.

EPD 신호궤적을 이용한 플라즈마 식각공정의 실시간 이상검출 (Real-time malfunction detection of plasma etching process using EPD signal traces)

  • 차상엽;이석주;고택범;우광방
    • 제어로봇시스템학회논문지
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    • 제4권2호
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    • pp.246-255
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    • 1998
  • This paper presents a novel method for real-time malfunction detection of plasma etching process using EPD signal traces. First, many reference EPD signal traces are collected using monochromator and data acquisition system in normal etching processes. Critical points are defined by applying differentiation and zero-crossing method to the collected reference signal traces. Critical parameters such as intensity, slope, time, peak, overshoot, etc., determined by critical points, and frame attributes transformed signal-to symbol of reference signal traces are saved. Also, UCL(Upper Control Limit) and LCL(Lower Control Limit) are obtained by mean and standard deviation of critical parameters. Then, test EPD signal traces are collected in the actual processes, and frame attributes and critical parameters are obtained using the above mentioned method. Process malfunctions are detected in real-time by applying SPC(Statistical Process Control) method to critical parameters. the Real-time malfunction detection method presented in this paper was applied to actual processes and the results indicated that it was proved to be able to supplement disadvantages of existing quality control check inspecting or testing random-selected devices and detect process malfunctions correctly in real-time.

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SPC 차트를 이용한 포트폴리오 관리 (Portfolio Management Using Statistical Process Control Chart)

  • 김동섭;류홍서
    • 산업공학
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    • 제20권2호
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    • pp.94-102
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    • 2007
  • Portfolio management deals with decision making on 'when' and 'how' to revise an existing portfolio. In this paper, we show that a classical statistical process control (SPC) chart for normal data, a wellestablished tool in quality engineering, can effectively be used for signaling times for revising a portfolio. Noting that the day-to-day performance of a portfolio may be auto-correlated, we use the exponentially weighted moving average center-line chart to develop an automatic portfolio management procedure. The portfolio management procedure is extensively tested on historical data of equities traded in the Korea Exchange (KRX), the American Stock Exchange (AMEX), and the New York Stock Exchange (NYSE). In comparison with the performances of the KOSPI, XAX, and NYA indices during the same time periods, results from these experiments show that SPC chart-based portfolio revision presents itself a convenient and reliable method for optimally managing portfolios.

반도체 제조공정의 Critical Dimension 변동에 대한 통계적 분석 (Statistical Analysis on Critical Dimension Variation for a Semiconductor Fabrication Process)

  • 박성민;이정인;김병윤;오영선
    • 산업공학
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    • 제16권3호
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    • pp.344-351
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    • 2003
  • Critical dimension is one of the most important characteristics of up-to-date integrated circuit devices. Hence, critical dimension control in a semiconductor wafer fabrication process is inevitable in order to achieve optimum device yield as well as electrically specified functions. Currently, in complex semiconductor wafer fabrication processes, statistical methodologies such as Shewhart-type control charts become crucial tools for practitioners. Meanwhile, given a critical dimension sampling plan, the analysis of variance technique can be more effective to investigating critical dimension variation, especially for on-chip and on-wafer variation. In this paper, relating to a typical sampling plan, linear statistical models are presented for the analysis of critical dimension variation. A case study is illustrated regarding a semiconductor wafer fabrication process.

통합공정관리에서 일반화가능도비 관리도의 설계 (Design of the GLR Chart in Integrated Process Control)

  • 천가영;이재헌
    • Communications for Statistical Applications and Methods
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    • 제17권3호
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    • pp.357-365
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    • 2010
  • 통합공정관리란 잡음이 내재하는 공정에 대하여 수정조치를 취하고, 수정활동 중 공정에 이상원인이 발생하면 이를 관리도를 통해 탐지하여 제거하는 절차를 일컫는다. 이 논문에서는 공정의 잡음모형으로 IMA(1,1) 모형을 가정하고 최소평균제곱오차 수정절차를 수행할 때 일반화가능도비 관리도를 사용하여 이상원인을 탐지하는 절차를 고려하고 있으며, 이러한 상황에서 일반화가능도비 관리도의 관리한계를 설정하는 설계 방법을 제안하였다. 이상원인의 효과로는 공정 평균의 지속적 변화와 지속적 흐름 그리고 공정 분산의 지속적 변화를 고려하였다.

통합공정관리에서 출력변수와 입력변수를 탐지하는 절차의 비교 (Comparison of monitoring the output variable and the input variable in the integrated process control)

  • 이재헌
    • Journal of the Korean Data and Information Science Society
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    • 제22권4호
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    • pp.679-690
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    • 2011
  • 통계적 공정관리 (statistical process control; SPC)와 자동공정관리 (automatic process control; APC)는 공정의 품질을 향상시키기 위하여 가장 널리 사용하는 방법이다. 이 두 종류의 관리절차는 서로 독립적으로 적용되고 연구되어져 왔지만, 현대의 생산 공정은 공정 자체가 복잡하고 혼합된 양상을 나타내기 때문에 두 관리절차를 병행하여 사용함으로써 관리효과를 증대시킬 수 있게 된다. 이와 같이 수정과 탐지를 동시에 사용하여 공정을 좀 더 효율적으로 관리하고자 하는 절차를 통합 공정관리 (integrated process control; IPC)라고 한다. IPC의 기본절차는 잡음이 내재하는 공정에 대하여 수정조치를 취하고, 이러한 수정활동 중 공정에 이상원인이 발생했는지 관리도를 통하여 이를 탐지하는 것이다. APC로 조정된 공정을 관리할 경우 일반적으로 출력변수를 관리통계량으로 사용하고 있으나, 입력변수를 관리통계량으로 사용하는 연구 결과들도 있다. 이 논문에서는 누적이동평균(integrated moving average; IMA) (1,1) 잡음모형과 최소평균제곱오차 (minimum mean square error; MMSE) 수정을 가정할 경우, 출력변수, 입력변수, 그리고 출력변수와 입력변수의 정보를 모두 이용하는, 즉 출력과 입력변수의 차이변수를 사용하는 절차의 효율을 비교하고 있다.