• Title/Summary/Keyword: talbot effect

Search Result 14, Processing Time 0.024 seconds

Study on Talbot Pattern for Grating Interferometer (격자간섭계를 위한 탈봇 패턴 연구)

  • Kim, Youngju;Oh, Ohsung;Kim, Jongyul;Lee, Seung Wook
    • Journal of radiological science and technology
    • /
    • v.38 no.1
    • /
    • pp.39-49
    • /
    • 2015
  • One of properties which X-ray and Neutron can be applied nondestructive test is penetration into the object with interaction leads to decrease in intensity. X-ray interaction with the matter caused by electrons, Neutron caused by atoms. They share applications in nondestructive test area because of their similarities of interaction mechanism. Grating interferometer is the one of applications produces phase contrast image and dark field image. It is defined by Talbot interferometer and Talbot-Lau interferometer according to Talbot effect and Talbot-Lau effect respectively. Talbot interferometer works with coherence beam like X-ray, and Talbot-Lau has an effect with incoherence beam like Neutron. It is important to expect the interference in grating interferometer compared normal nondestructive system. In this paper, simulation works are conducted according to Talbot and Talbot-Lau interferometer in case of X-ray and Neutron. Variation of interference intensity with X-ray and Neutron based on wave theory is constructed and calculate elements consist the system. Additionally, Talbot and Talbot-Lau interferometer is simulated in different kinds of conditions.

Moir'e fringes generated by the superposition of elongated circular grating and Talbot image and their applications (Elongated Circular Grating의 Talbot 결상을 이용한 무아레 무늬 발생과 응용)

  • Lee, Sang-Il;Jo, jae-Heung;Chang, Soo;Rim, Cheon-Seog
    • Korean Journal of Optics and Photonics
    • /
    • v.12 no.1
    • /
    • pp.25-31
    • /
    • 2001
  • The Talbot effect of an elongated circular (EC) grating composed of a line grating and two semicircular gratings with well matched pitches is experimentally presented. As the relative positions between the fixed EC grating and the moving Talbot image of another EC grating or a self Talbot image are one-dimensionally deformed, we can visually observe moire fringes generated by their superposition. Two examples of their applications, that is, the measurement of the wedged angle of a wedged prism and of the fine rotational angle of a mirror are described.cribed.

  • PDF

Talbot imaging of periodic amplitude objects and its visibility (주기적인 진폭격자들에 의한 Talbot 결상 및 가시도 분석)

  • Kim, Young-Ran;lee, Seung-Bok;Jo, jae-Heung;Chang, Soo;Rim, Cheon-Seog
    • Korean Journal of Optics and Photonics
    • /
    • v.12 no.2
    • /
    • pp.83-90
    • /
    • 2001
  • The Talbot effect for periodic objects with the spatial period p illuminated by expanded coherent light is analyzed by Fresnel diffraction theory, and the Talbot distance (Zr) at which we can observe 1: 1 imaging without any lenses can be defined. We confmned experimentally the Talbot imaging of line, circular, X -type and '||'&'||'copy;-type 2 dimensional alTay gratings at ZT. At the same time, we observed phase reversed Talbot imaging at Zr/2 and Talbot subimage with p/2 at Zr/4 and 3Zr/4. The visibility of Talbot images as a function of the number of slits of the input grating was measured by the FFf (Fast Fourier Transform) results of these images. As a result stationary maximum visibility of V = 0.25 was obtained from grating numbers with more than 15 slit pairs.

  • PDF

Single Exposure Imaging of Talbot Carpets and Resolution Characterization of Detectors for Micro- and Nano- Patterns

  • Kim, Hyun-su;Danylyuk, Serhiy;Brocklesby, William S.;Juschkin, Larissa
    • Journal of the Optical Society of Korea
    • /
    • v.20 no.2
    • /
    • pp.245-250
    • /
    • 2016
  • In this paper, we demonstrate a self-imaging technique that can visualize longitudinal interference patterns behind periodically-structured objects, which is often referred to as Talbot carpet. Talbot carpet is of great interest due to ever-decreasing scale of interference features. We demonstrate experimentally that Talbot carpets can be imaged in a single exposure configuration revealing a broad spectrum of multi-scale features. We have performed rigorous diffraction simulations for showing that Talbot carpet print can produce ever-decreasing structures down to limits set by mask feature sizes. This demonstrates that large-scale pattern masks may be used for direct printing of features with substantially smaller scales. This approach is also useful for characterization of image sensors and recording media.

Talbot Interferometry for Measuring the Focal Length of a Lens without Moiré Fringes

  • Lee, Sukmock
    • Journal of the Optical Society of Korea
    • /
    • v.19 no.2
    • /
    • pp.165-168
    • /
    • 2015
  • A simple method to determine the focal length of a lens using the Talbot image is presented. This method uses only one grating, requiring neither Moir$\acute{e}$ fringe analysis nor the angle between the gratings. The original Fourier transform was used to access the spectrum beyond the limitation set of the usual fast Fourier transform to determine the (de)magnification accurately enough to be used for the focal length. A set of Talbot images simulated numerically with the Fresnel diffraction integral was used to demonstrate the method. For focal lengths between 5550 mm and 5650 mm, the mean difference between the focal lengths determined from the Talbot images and the true values was 3.3 mm with the standard deviation of the difference being 3.8 mm. The true focal lengths can be recovered with an accuracy of 0.06%.

Sensitivity Improvement of Shadow Moiré Technique Using LED Light and Deformation Measurement of Electronic Substrate (LED 광을 이용한 그림자 무아레 방법의 감도 향상 및 모바일 전자 기판의 변형 측정)

  • Yang, Heeju;Joo, Jinwon
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.26 no.4
    • /
    • pp.141-148
    • /
    • 2019
  • Electronic substrates used in a mobile device is composed of various materials, and when the temperature is changed during manufacturing or operating, thermal deformation and stress concentration occur due to the difference in thermal expansion coefficient of each material. The shadow moiré technique is a non-contact optical method that measures shape or out-of-plane displacement over the entire area, but it is necessary to overcome the Talbot effect for high sensitivity applications. In this paper, LED light sources of various wavelengths was used to overcome the Talbot effect caused in the shadow moiré technique. By using the phase shift method, an experimental method to retain the measurement sensitivity within 10 ㎛/fringe was proposed and evaluated, and this method is applied to the thermal deformation measurement of the mobile electronic substrate. In the case of using white light, there were several areas that could not be measured due to the Talbot effect, but in the case of using blue LED light, it was shown that a precise moiré pattern with a sensitivity of 6.25 ㎛/fringe could be obtained in most areas.

Development of Optical Head Unit for Nano Optical Probe Array (나노 광 프로브 어레이 구현을 위한 광학 헤드 유닛 개발)

  • Kim H.;Lim J.;Kim S.;Han J.;Kang S.
    • Transactions of Materials Processing
    • /
    • v.15 no.1 s.82
    • /
    • pp.21-26
    • /
    • 2006
  • A optical head unit for nano optical probe array was developed. The optical probe array is generated by Talbot effect. The shape and thickness of microlens array(MLA) were designed to minimize the spot size at the foci of MLA. To increase the optical efficiency of the system and obtain the large tolerance for fabrication, aperture size was theoretically optimized. Then microlens illuminated aperture array(MLIAA) as an optical head unit was fabricated using a ultra violet(UV) molding process on aluminum aperture array. In this process, Al aperture array was fabricated separately using the photolithography and reactive ion etching(RIE) process. Optical properties of the generated optical probes were measured and compared at Talbot distance from the aperture array having a diameter of $1{\mu}m$ and MLIAA.

Development of Optical Head Unit for Nano Optical Probe Array (나노 광 프로브 어레이 구현을 위한 광학 헤드 유닛 개발)

  • Kim H.;Lim J.;Kim S.;Han J.;Kang S.
    • Proceedings of the Korean Society for Technology of Plasticity Conference
    • /
    • 2005.09a
    • /
    • pp.29-34
    • /
    • 2005
  • A optical head unit for nano optical probe away was developed. The optical probe array is generated by Talbot effect. The shape and thickness of microlens array(MLA) were designed to minimize the spot size at the foci of MLA. To increase the optical efficiency of the system and obtain the large tolerance for fabrication, aperture size was theoretically optimized. Then microlens illuminated aperture array(MLIAA) as an optical head unit was fabricated using a ultra violet(UV) molding process on aluminum aperture array. In this process, Al aperture array was fabricated separately using the photolithography and reactive ion etching(RIE) process. Optical properties of the generated optical probes were measured and compared at Talbot distance from the aperture array having a diameter of $1{\mu}m$ and MLIAA.

  • PDF

Compression characteristics of filling gangue and simulation of mining with gangue backfilling: An experimental investigation

  • Wang, Changxiang;Shen, Baotang;Chen, Juntao;Tong, Weixin;Jiang, Zhe;Liu, Yin;Li, Yangyang
    • Geomechanics and Engineering
    • /
    • v.20 no.6
    • /
    • pp.485-495
    • /
    • 2020
  • Based on the movement characteristics of overlying strata with gangue backfilling, the compression test of gangue is designed. The deformation characterristics of gangue is obtained based on the different Talbot index. The deformation has a logarithmic growth trend, including sharp deformation stage, linear deformation stage, rheological stage, and the resistance to deformation changes in different stages. The more advantageous Talbot gradation index is obtained to control the surface subsidence. On the basis of similarity simulation test with gangue backfilling, the characteristics of roof failure and the evolution of the supporting force are analyzed. In the early stage of gangue backfilling, beam structure damage directly occurs at the roof, and the layer is separated from the overlying rock. As the working face advances, the crack arch of the basic roof is generated, and the separation layer is closed. Due to the supporting effect of filling gangue, the stress concentration in gangue backfilling stope is relatively mild. Based on the equivalent mining height model of gangue backfilling stope, the relationship between full ratio and mining height is obtained. It is necessary to ensure that the gradation of filling gangue meets the Talbot distribution of n=0.5, and the full ratio meets the protection grade requirements of surface buildings.

Sensitivity Enhancement of Shadow Moiré Technique for Warpage Measurement of Electronic Packages (반도체 패키지의 굽힘변형 측정을 위한 그림자 무아레의 감도향상 기법연구)

  • Lee, Dong-Sun;Joo, Jin-Won
    • Journal of the Microelectronics and Packaging Society
    • /
    • v.22 no.3
    • /
    • pp.57-65
    • /
    • 2015
  • Electronic packages consist of various materials, and as temperature changes, warpage occurs because of the difference in coefficient of thermal expansion. Shadow $moir{\acute{e}}$ is non-contact, whole field measurement technique for out-of-plane displacement. However, the technique has low sensitivity above $50{\mu}m/fringe$, it is not adequate for the warpage measurement in some circumstance. In this paper, by applying phase shifting process to the traditional shadow $moir{\acute{e}}$, measurement system having enhanced sensitivity of $12.5{\mu}m/fringe$ is constructed. Considering Talbot effect, the measurement is carried out in the half Talbot area. Shadow fringe pattern having four times enhanced sensitivity is obtained by the image process with four shadow fringes. The measurement technique is applied to the fibered package substrate and coreless package substrate for measuring warpages at room temperature and at about $100^{\circ}C$.