A Self-Consistent Analytic Threshold Voltage Model for Thin SOI N-channel MOSFET

  • Choi, Jin-Ho (Department of Electrical Engineering Korea Advanced Institute of Science and Technology) ;
  • Song, Ho-Jun (Department of Electrical Engineering Korea Advanced Institute of Science and Technology) ;
  • Suh, Kang-Deog (Department of Electrical Engineering Korea Advanced Institute of Science and Technology) ;
  • Park, Jae-Woo (Department of Electrical Engineering Korea Advanced Institute of Science and Technology) ;
  • Kim, Choong-Ki (Department of Electrical Engineering Korea Advanced Institute of Science and Technology)
  • 발행 : 1990.11.17

초록

An accurate analytical threshold model is presented for fully depleted SOI which has a Metal-Insulator-Semiconductor-Insulator-Metal structure. The threshold voltage is defined as the gate voltage at which the second derivative of the inversion charge with respect to the gate voltage is maximum. Therefore the model is self-consistent with the measurement scheme. Numerical simulations show good agreement with the model with less than 3% error.

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