측온저항체 온도센서용 백금 박막의 증착과 그 특성

The Deposition of Platinum Thin Films for RTD and its Characteristics

  • 정귀상 (동서대학교 메카트로닉스공학과) ;
  • 노상수 (동서대학교 메카트로닉스공학과)
  • 발행 : 1996.05.01

초록

Platinum thin films were deposited on Si-wafer by DC magnetron sputtering for RTD (Resistance Thermometer Devices). We investigated the physical and electrical characteristics of these films under various conditions, the input power, working vacuum, temperature of substrate and also after annealing these films. The deposition rate was increased with increasing the input power but decreased with increasing Ar gas pressure. The resistivity were decreased wish increasing the temperature of substrate and the annealing time at 1000$^{\circ}C$. At substrate temperature 300$^{\circ}C$, input power 7(w/$\textrm{cm}^2$), working vacuum 5mtorr and annealing conditions 1000$^{\circ}C$, 240 min we obtained 10.65${\mu}$$.$cm, resistivity of Pt thin film closed to the bulk value.

키워드