A STUDY ON THE EFFECT OF METALLIC IMPURITIES ON MICROROUGHNESS OF SI WAFER

  • Choi, Hyung-Seok (Semiconductor Materials Laboratory, Division of Materials Science Engineering, Hanyang University) ;
  • Jeon, Hyeong-Tag (Semiconductor Materials Laboratory, Division of Materials Science Engineering, Hanyang University)
  • Published : 1998.08.01