DEFECT FORMATION IN SILICON WAGER SURFACE LAYER AND ITS INFLUENCE ON THE BULK PROPERTIES

  • Kira L. Enisherlova (Sc. institute ″Pulsar″) ;
  • Galina K. Ippolitova (ELLITNA-NT, R&D Co., Dm) ;
  • Tatiana M. Tkacheva (ELLITNA-NT, R&D Co., Dm) ;
  • Petrov, George-N (ELLITNA-NT, R&D Co., Dm)
  • Published : 1998.08.01