Structure Properties of Semiconductor Devices to Protect Electronic Circuit

회로보호용 반도체 소자의 구조적 특성

  • 홍경진 (광주대학교 컴퓨터전자통신공학부) ;
  • 민용기 (광주대학교 컴퓨터전자통신공학부) ;
  • 조재철 (초당대학교 전자공학과)
  • Published : 2001.07.01

Abstract

When varistors for circuit protection is used at high voltage, it's operation properties were unstable because of leakage current and nonlinear coefficient with grain size. For the purpose of improving of ZnO varistor properties, high voltage ZnO varistor was fabricated with Y$_2$O$_3$addition. Electrical properties were investigated according to sintering conditions and mixing conditions. ZnO varistors was shown ohmic Properties when it's applied voltage was below critical voltage. It was shown non-ohmic properties over critical voltage, because current was increased with decreasing resistance.

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