The electrical and optical properties of transparent ZnO:Al films using HCl wet chemical etching

HCL 습식 에칭에 의한 ZnO:Al 투명전도막의 전기적, 광학적 특성

  • 유진수 (한국에너지기술연구원 태양광발전연구팀) ;
  • 이정철 (한국에너지기술연구원 태양광발전연구팀) ;
  • 강기환 (한국에너지기술연구원 태양광발전연구팀) ;
  • 김석기 (한국에너지기술연구원 태양광발전연구팀) ;
  • 윤경훈 (한국에너지기술연구원 태양광발전연구팀) ;
  • 송진수 (한국에너지기술연구원 태양광발전연구팀) ;
  • 박이준 (한국에너지기술연구원 태양광발전연구팀)
  • Published : 2002.05.17

Abstract

Transparent conducting aluminum-doped Zinc oxide films (ZnO:Al) were prepared by rf magnetron sputtering on glass (Coming 1737) substrate as a variation of the deposition condition. After deposition, the smooth ZnO:Al films were etched in diluted HCl (0.5%) to examine the electrical and surface morphology properties as a variation of the time. The most important deposition condition of surface-textured ZnO films by chemical etching is the processing pressure and the substrate temperature. In low pressures (0.9mTorr) and high substrate temperatures $({\leq}300^{\circ}C)$, the surface morphology of films exhibits a more dense and compact film structure with effective light-trapping to apply the silicon thin film solar cells.

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