근접장 마이크로파 현미경을 이용한 Copper(II)-phthalocyanine 박막의 특성 연구

Characterization of thin film properties of Copper(II)-Phthalocyanine using a near-field scanning microwave microscope

We report the microwave reflection coefficient $S_{11}$ of copper(II)-phthalocyanine(CuPc) using a near-field microwave microscope(NSMM) in order to understand the intrinsic electromagnetic properties of organic materials. For a NSMM system, a high-quility microstip resonator coupled with a dielectric resonator was used. The reflection coefficient $S_{11}$ was changed by the preparation conditions of CuPc thin films. We compared the reflection coefficient with crystal phase, surface morphology, UV absorption spectra and x-ray diffraction results.