The Analysis of life distribution for Light Source using degradation Tests of Luminous Flux

광속의 열화시험을 이용한 광원의 수명분포 분석

  • Lee, S.H. (Korea Institute of Lighting Technology) ;
  • Shin, S.W. (Korea Institute of Lighting Technology) ;
  • Cho, M.R. (Korea Institute of Lighting Technology) ;
  • Hwang, M.K. (Korea Institute of Lighting Technology) ;
  • Yang, S.Y. (Korea Institute of Lighting Technology)
  • Published : 2005.11.04

Abstract

In this paper, we observed degradation characteristics of luminous flux for new light source. Because degradation tests can be a useful tool for assessing the reliability when few or even no failures are expected in a life tests. And we use a simple random coefficient degradation model to induce most suitable equation of degradation. As a result, exponential distribution and equation is best suitable model for new light source.

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