The dependence of the electrical characteristics of MgO on temperature in an AC PDP

  • Ha, Chang-Hoon (School of Electrical Engineering, Seoul National University) ;
  • Jeong, Dong-Chul (School of Electrical Engineering, Seoul National University) ;
  • Kim, Joong-Kyun (Department of electrical engineering, Hankyong National University) ;
  • Whang, Ki-Woong (School of Electrical Engineering, Seoul National University)
  • 발행 : 2005.07.19

초록

We studied the dependence of the electrical characteristics of MgO protecting layer on temperature in an AC PDP cell. Careful measurements of the surface resistance of MgO were performed for the temperature range from room temperature to $100^{\circ}C$ with and without the VUV illumination. Experimental results show that the resistivity is affected by not only the temperature but also VUV irradiation. The measurement of wall charge distribution and the address discharge delay time as to the temperature show that the resistivity change of MgO may affect the wall voltage and consequently the discharge delay time.

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