Microstructural analysis and characterization of 1-D ZnO nanorods grown on various substrates

다양한 기판위에 성장한 1차원 ZnO 나노막대의 특성평가 및 미세구조 분석

  • Kong, Bo-Hyun (Sungkyunkwan University, School of Advanced Materials Science & Engineering) ;
  • Kim, Dong-Chan (Sungkyunkwan University, School of Advanced Materials Science & Engineering) ;
  • Cho, Hyung-Koun (Sungkyunkwan University, School of Advanced Materials Science & Engineering)
  • 공보현 (성균관대학교 신소재공학부) ;
  • 김동찬 (성균관대학교 신소재공학부) ;
  • 조형균 (성균관대학교 신소재공학부)
  • Published : 2006.06.22

Abstract

I-D ZnO nanostructures were fabricated by thermal evaporation method on Si(100), GaN and $Al_2O_3$ substrates without a catalyst at the reaction temperature of $700^{\circ}C$. Only pure Zn powder was used as a source material and Ar was used as a carrier gas. The shape and growth direction of synthesized ZnO nanostructures is determined by the crystal structure and the lattice mismatch between ZnO and substrates. The ZnO nanostructure on Si substrate were inclined regardless of their substrate orientation. The origin of ZnO/Si interface is highly lattice-mismatched and the surface of the Si substrate inevitably has the $SiO_2$ layer. The ZnO nanostructure on the $Al_2O_3$ substrate was synthesized into the rod shape and grown into particular direction. For the GaN substrate, however, ZnO nanostructure with the honeycomb-like shape was vertically grown, owing to the similar lattice parameter with GaN substrate.

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