Proceedings of the KIEE Conference (대한전기학회:학술대회논문집)

The Korean Institute of Electrical Engineers (대한전기학회)
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A Path Planning Method for Automatic Optical Inspection Machines with Line Scan Camera

라인스캔 카메라 형 광학검사기틀 위한 경로계획 방법

  • Chae, Ho-Byeong (Dept. of Control and Instrumentation Eng., CBITRC, ChungBuk Natioal University) ;
  • Kim, Hwan-Yong (Dept. of Control and Instrumentation Eng., CBITRC, ChungBuk Natioal University) ;
  • Park, Tae-Hyoung (Dept. of Control and Instrumentation Eng., CBITRC, ChungBuk Natioal University)
  • 채호병 (충북대학교 대학원 제어계측공학과 및 CBITRC) ;
  • 김환용 (충북대학교 대학원 제어계측공학과 및 CBITRC) ;
  • 박태형 (충북대학교 대학원 제어계측공학과 및 CBITRC)
  • Published : 2007.10.26
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Abstract

We propose a path planning method to decrease a inspection lead time of line scan camera in SMT(surface mount technology) in-line system. The inspection window area of printed circuit board should be minimized to consider the FOV(field of view) of line scan camera so that line scan inspector is going to find a optimal solution of path planning. We propose one of the hierarchical clustrering algorithm for a given board. Comparative simulation results are presented to verify the usefulness of proposed method.

Keywords