한국정보디스플레이학회:학술대회논문집

The Korean Infomation Display Society (한국정보디스플레이학회)
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Reconstruction Characteristics of MgO (111) Textured Protective Layer by Over-Frequency Accelerated Discharge in AC Plasma Display Pannel

  • Kwon, Sang-Koo (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
  • Kim, Jeong-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
  • Moon, Seung-Kyu (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
  • Kim, Hyun-Ha (PDP Materials Group, Digital Display Research Laboratory, LG Electronics Inc.) ;
  • Park, Kyu-Ho (Materials Characterization Group, Device & Materials Laboratory, LG Electronics Institute of Technology) ;
  • Kim, Sung-Tae (PDP Materials Group, Digital Display Research Laboratory, LG Electronics Inc.)
  • Published : 2007.08.27
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Abstract

The reconstruction characteristics of MgO (111) textured protective layer by over-frequency accelerated discharge in AC-PDP were investigated and correlated to the variations of electronic structures. The reconstruction process and exaggerated grain growth (EGG) were explained by defect-assisted 2-D nucleation and growth mechanism combined with charged cluster model.

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