Abstract
We have calculated differential reflection coefficient for isolated well structure of micro-scale, etched on dielectric surface. The differential reflection coefficient is computed using Green's second integral theorem. The purpose of our computation is to find a class of well profiles which give maximal diffusive scattering. To have such a maximal effect, we have concluded that the waist radius of Gaussian beam and its wavelength should be comparable to the well width and that well depth has to be larger than a wavelength. Exact calculation of differential reflection coefficients of dielectric surface with isolated structure on it may be used for the examination of dielectric surfaces and also in making simple but efficient diffuser.