A Newly Designed Contact Profiler for Microstructure

새로운 구조의 접촉식 미세구조 프로필러

  • Choi, Dong-Jun (LG Electronics) ;
  • Choi, Jai-Seong (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology) ;
  • Choi, In-Mook (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology) ;
  • Kim, Soo-Hyun (Dept. of Mechanical Engineering, Korea Advanced Institute of Science and Technology)
  • 최동준 (LG전자기술원 소자재료연구소) ;
  • 최재성 (한국과학기술원 기계공학과) ;
  • 최인묵 (한국과학기술원 기계공학과) ;
  • 김수현 (한국과학기술원 기계공학과)
  • Published : 2002.03.01

Abstract

A simple and low cost stylus profiler made of ferrite cores is developed. The devised profiler consists of a contact probe, a measuring transducer, a signal processing unit, and a motorized stage. The contact probe attached to 4-bar spring maintains sufficient stiffness to protect disturbances. An overlap-area type inductive position sensing system is selected as a measuring transducer, which has high sensitivity, repeatability and linearity. The transducer is composed of coil bundles and ferrite cores which have good electromagnetic characteristics in spite of low cost. The repeatability of the profiler with the proposed inductive sensing system is better than 50nm. Experimental results are shown that the proposed profiler can measure the line or 3D profile of an object with sub-micron features.

Keywords

References

  1. Web site, http://www.taylor-hobson.com
  2. Web site, http://www.veeco.com
  3. Web site, http://www.tencor.com
  4. Jeff Donnelly, Winston Sze, 'Stylus profilers in AMLCD manufacturing,' Solid State Technology, JUNE, pp. 157-160, 1996
  5. Jeffrey B et al, 'Stylus NanoProfilometry: A new approach to CD metrology,' Solid State Technology, June, pp. 45-53, 1999
  6. E. C. Teague, F. E. Scire, S. M. Baker and S. W. Jensen, 'Three-dimensional stylus profilometry,'Wear, Vol. 83, pp. 1-12, 1982 https://doi.org/10.1016/0043-1648(82)90335-0
  7. Euan Morrison, 'A Prototype Scanning Stylus Profilometer for Rapid Measurement of Small Surface Areas,' Int. J. Mach. Tools Manufact., Vol. 35, No. 2, pp. 352-331, 1995 https://doi.org/10.1016/0890-6955(94)P2390-2
  8. Euan Morrison, 'The development of a prototype high-speed stylus profilometer and its application to rapid 3D surface measurement,' Nanotechnology 7, pp. 37-42, 1996 https://doi.org/10.1088/0957-4484/7/1/005
  9. V.B. Badami, S.T. Smith, et al, 'A portable three-dimensional stylus profile measuring instrument,' Precision Engineering, Vol. 18, pp. 147-156, 1996 https://doi.org/10.1016/0141-6359(95)00071-2
  10. 熊田毅史, 三井公之, 中暢和雄, 生田日英幸, '粗微動連動制微による表面租さ測定に關する硏究,' 精密工學會誌, Vol. 63, No. 10, pp. 1439-1443, 1997
  11. K. C. Fan, C. Y. Lin and L. H. Shyu, 'The development of a low-cost focusing probe for profile measurement,' Meas. Sci. Technol. 11, N1-N7, 2000 https://doi.org/10.1088/0957-0233/11/1/401
  12. 최동준, 최인묵, 김수현, '인덕턴스형 미소 변위 측정 시스템과 응답 특성의 분석,' 한국정밀공학회지, 제 18 권, 제 3 호, pp. 189-194, 2001
  13. Dong-June Choi and Soo Hyun Kim, 'Flexible Inductive Transducer with Magnetic Resistance Influenced by Variable Overlap Area,' Jpn. J. Appl. Phys. Vol. 40, pp. 5153-5158, 2001 https://doi.org/10.1143/JJAP.40.5153
  14. Barry E Jones, 'Sensors in industrial metrology,' J. Phys. E: Sci. Instrum., Vol. 20, pp. 1113-1126, 1987 https://doi.org/10.1088/0022-3735/20/9/007
  15. Web site: http://www.renishaw.com
  16. D. K. Biegelsen, F. A. Ponce and J. C. Tranomtana and S. M. Koch, 'Ion milled tips for scanning tunneling microscopy,' Appl. Phys. Lett. Vol. 50, No. 11, pp. 696-698, 187 https://doi.org/10.1063/1.98070
  17. R. Nicolaides, et al, 'Scanning tunneling microscope tip structures,' J. Vac. Sci. Technol., A. Vol. 6, No. 2, pp. 445-447, 1988 https://doi.org/10.1116/1.575392