Korean Journal of Optics and Photonics (한국광학회지)

Optical Society of Korea (한국광학회)
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Systematic error calibration of 2-axis lateral shearing interferometer

2축 층밀리기 간섭계의 계통오차 보정

  • 김승우 (한국과학기술원 기계공학과) ;
  • 이혁교 (한국과학기술원 기계공학과)
  • Published : 2002.04.01
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Abstract

We present a new self-calibration method to remove the systematic error of a 2-axis lateral shearing interferometer that has been specially designed for optical testing of aspheric optics. The method takes multiple measurements by rotating the test optics and extracts the systematic error by fitting the measured wavefronts into the Zernike polynomials. The method works with arbitrary azimuthal angles for test optics rotation, which offers an advantage of correcting the error induced by the non-orthogonality of the two axes of wavefront shearing as well as the error caused by the optical components of the interferometer system itself.

비구면 광학부품의 수차 측정 및 성능 평가를 위해 특별 설계된 층밀리기 간섭계를 소개하고, 이와 더불어 층밀리기 간섭계가 갖는 자체의 계통오차를 측정결과로부터 제거하기 위한 보정 방법을 제안한다. 층밀리기 간섭계의 계통오차는 크게 간섭광학계가 갖는 광학오차와 간섭계의 기구부의 불완전에 기인한 층밀리기 방향의 직교오차로 구분할 수 있다. 이들 두 계통 오차들은 모두 본 논문에서 제안하는 방법으로 모두 보정될 수 있다. 보정 방법은 측정 대상물을 간섭계의 광축을 중심으로 회전하여 측정결과로부터 계통오차를 분리하는 자가보정 원리에 근거한다.

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References

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