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Polarized Light Scattering Spectroscopy for Particle Size Measurement on Surface

편광산란분광법을 이용한 표면의 입자 크기 측정

  • Cho, Hyoung-Jun (Department of Physics, Basic Research Institute. Cheju National University) ;
  • Choi, Chi-Kyu (Department of Physics, Basic Research Institute. Cheju National University) ;
  • Kim, Doo-Chol (Department of Physics, Basic Research Institute. Cheju National University) ;
  • Yu, Young-Hun (Department of Physics, Basic Research Institute. Cheju National University)
  • 조형준 (제주대학교 물리학과, 기초과학연구소) ;
  • 최치규 (제주대학교 물리학과, 기초과학연구소) ;
  • 김두철 (제주대학교 물리학과, 기초과학연구소) ;
  • 유영훈 (제주대학교 물리학과, 기초과학연구소)
  • Published : 2005.12.01

Abstract

We used the polarized light scattering spectroscopy(PLSS) to get selectively the particle size information on a surface in optically diffuse material, and we analyzed the experimental results by Mie scattering theory. We found that the PLSS was the proper method fer getting the surface information in optically diffuse material. This method is able to be used in biotechlology area for diagnostics.

편광 광산란 분광법을 이용하여 광 확산물질의 표면 정보만을 선택적으로 얻었으며, Mie 산란 이론으로 표면의 산란체 크기 정보를 얻었다. 그 결과 편광 광산란 분광법이 광 확산 물체의 표면 정보만을 측정하는데 적절한 방법임을 확인하였고, 이 연구 결과는 세포와 같은 광 확산 물체를 측정하는데 이용될 수 있다.

Keywords

References

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