Journal of the Institute of Electronics Engineers of Korea SD (대한전자공학회논문지SD)

The Institute of Electronics and Information Engineers (대한전자공학회)
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Design of Test Access Mechanism for AMBA based SoC

AMBA 기반 SoC 테스트를 위한 접근 메커니즘 설계

  • Min, Pil-Jae (Department of Computer Science & Engineering, Hanyang University) ;
  • Song, Jae-Hoon (Department of Computer Science & Engineering, Hanyang University) ;
  • Yi, Hyun-Bean (Department of Computer Science & Engineering, Hanyang University) ;
  • Park, Sung-Ju (Department of Electrical Engineering Computer Science, Hanyang University)
  • 민필재 (한양대학교 컴퓨터공학과) ;
  • 송재훈 (한양대학교 컴퓨터공학과) ;
  • 이현빈 (한양대학교 컴퓨터공학과) ;
  • 박성주 (한양대학교 전자컴퓨터공학부)
  • Published : 2006.10.25
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Abstract

Test Interface Controller (TIC) provided by ARM Ltd. is widely used for functional testing of System-on-Chip (SoC) adopting Advanced Microcontroller Bus Architecture (AMBA) bus system. Accordingly, this architecture has a deficiency of not being able to concurrently shifting in and out the structural scan test patterns through the TIC and AMBA bus. This paper introduces a new AMBA based Test Access Mechanism (ATAM) for speedy testing of SoCs embedding ARM cores. While preserving the compatability with the ARM TIC, since scan in and out operations can be performed simultaneously, test application time through the expensive Automatic Test Equipment (ATE) can be drastically reduced.

Advanced Microcontroller Bus Architecture (AMBA) 기반 System-on-Chip (SoC)에서는 기능적 테스트를 위해 ARM사의 Test Interface Controller (TIC)를 사용한다. 따라서 구조적 스캔 테스트 패턴도 TIC와 AMBA 버스를 통해 인가하면서 스캔입력과 출력을 동시에 수행할 수 없다는 단점이 있다. 본 논문에서는 ARM 코어를 사용하는 SoC 테스트를 위한 AMBA based Test Access Mechanism (ATAM)을 제안한다. 기존 TIC와의 호환성을 유지하고 스캔 입력과 출력을 동시에 할 수 있으므로 고가의 Automatic Test Equipment (ATE)를 통한 테스트 시간을 대폭 절감할 수 있다.

Keywords

References

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