대한임베디드공학회논문지 (IEMEK Journal of Embedded Systems and Applications)

대한임베디드공학회 (Institute of Embedded Engineering of Korea)
권호 표지

아날로그 회로의 난검출 고장을 위한 효과적인 진단 및 테스트 기법

Effective Techniques for Diagnosis and Test of Hard-to-Detect Faults in Analog Circuits

  • 이재민 (관동대학교 전자정보통신공학부)
  • 투고 : 2009.01.05
  • 심사 : 2009.03.16
  • 발행 : 2009.03.31
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초록

Testing of analog(and mixed-signal) circuits has been a difficult task for test engineers and effective test techniques to solve these problems are required. This paper develops a new technique which increases fault detection and diagnosis rates for analog circuits by using extended MTSS (Modified Time Slot Specification) technique based on MTSS proposed by the author. High performance current sensors with digital outputs are used as core components for these techniques. A fault diagnosis structure with minimal hardware overhead in ATE is also described.

키워드

참고문헌

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  8. J. M. Lee, "Specification-based Analog and Mixed-signal Circuits Test with Minimal Built-In Hardware Overhead", Proceedings of KIERE Summer Conference, pp.633-636, June 2006.