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Optimization of Electrochemical Etching Parameters in Porous Silicon Layer Transfer Process for Thin Film Solar Cell

초박형 태양전지 제작에 Porous Silicon Layer Transfer기술 적용을 위한 전기화학적 실리콘 에칭 조건 최적화에 관한 연구

  • Lee, Ju-Young (Dept. of Materials Science and Engineering, Hongik University) ;
  • Koo, Yeon-Soo (Dept. of Manufacture and Metallurgical Engineering, Gwangyang Health College) ;
  • Lee, Jae-Ho (Dept. of Materials Science and Engineering, Hongik University)
  • 이주영 (홍익대학교 신소재공학과) ;
  • 구연수 (광양보건대학 제철금속과) ;
  • 이재호 (홍익대학교 신소재공학과)
  • Received : 2011.02.10
  • Accepted : 2011.03.17
  • Published : 2011.03.31

Abstract

Fabrication of porous silicon(PS) double layer by electrochemical etching is the first step in process of ultrathin solar cell using PS layer transfer process. The porosity of the porous silicon layer can be controlled by regulating the formation parameters such as current density and HF concentration. PS layer is fabricated by electrochemical etching in a chemical mixture of HF and ethanol. For electrochemical etching, highly boron doped (100) oriented monocrystalline Si substrates was used. Ths resistivity of silicon is $0.01-0.02\;{\Omega}{\cdot}cm$. The solution composition for electrochemical etching was HF (40%) : $C_2H_5OH$(99 %) : $H_2O$ = 1 : 1 : 2 (by volume). In order to fabricate porous silicon double layer, current density was switched. By switching current density from low to high level, a high-porosity layer was fabricated beneath a low-porosity layer. Etching time affects only the depth of porous silicon layer.

전기화학적 에칭을 이용한 다공성 실리콘 이중층 형성은 초박형 태양전지 제작에서 PS layer transfer 기술을 적용하기 위한 선행 공정이다. 다공성 실리콘 층의 다공도는 전류밀도와 에칭용액 내 불산의 농도를 조절하여 제어할 수 있다. 전기화학적 에칭을 이용한 다공성 실리콘 형성을 위하여 비저항 $0.01-0.02\;{\Omega}{\cdot}cm$의 p-type (100)의 실리콘 웨이퍼를 사용하였으며, 에칭용액의 조성은 HF (40%) : $C_2H_5OH$(99 %) : $H_2O$ = 1 : 1 : 2 (volume)으로 고정하였다. PS layer transfer 기술에 사용되는 다공성 실리콘 이중층을 형성하기 위해서 에칭 도중 전류밀도를 낮은 전류밀도 조건에서 높은 전류밀도 조건으로 변환하여 low porosity layer 하부에 high porosity layer를 형성할 수 있다.

Keywords

References

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