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Efficient Implementation of Single Error Correction and Double Error Detection Code with Check Bit Pre-computation for Memories

  • Received : 2012.04.30
  • Published : 2012.12.31

Abstract

In this paper, efficient implementation of error correction code (ECC) processing circuits based on single error correction and double error detection (SEC-DED) code with check bit pre-computation is proposed for memories. During the write operation of memory, check bit pre-computation eliminates the overall bits computation required to detect a double error, thereby reducing the complexity of the ECC processing circuits. In order to implement the ECC processing circuits using the check bit pre-computation more efficiently, the proper SEC-DED codes are proposed. The H-matrix of the proposed SEC-DED code is the same as that of the odd-weight-column code during the write operation and is designed by replacing 0's with 1's at the last row of the H-matrix of the odd-weight-column code during the read operation. When compared with a conventional implementation utilizing the odd-weight- column code, the implementation based on the proposed SEC-DED code with check bit pre-computation achieves reductions in the number of gates, latency, and power consumption of the ECC processing circuits by up to 9.3%, 18.4%, and 14.1% for 64 data bits in a word.

Keywords

References

  1. Z. Al-Ars and A. J. van de Goor, "Soft faults and importance of stresses in memory testing," Design, Automation and Test in Europe Conference and Exhibition, pp. 1084-1089, Feb. 2004.
  2. R. C. Baumann, "Radiation-induced soft errors in advanced semiconductor technologies," Device and Materials Reliability, IEEE Transactions on, vol. 5, pp. 305-316, 2005. https://doi.org/10.1109/TDMR.2005.853449
  3. P. E. Dodd, M. R. Shaneyfelt, J. R. Schwank, and J. A. Felix, "Current and future challenges in radiation effects on CMOS electronics," Nuclear Science, IEEE Transactions on, vol. 57, pp. 1747-1763, 2010. https://doi.org/10.1109/TNS.2010.2042613
  4. R. W. Hamming, "Error detecting and error correcting code," Bell System Technical Journal, vol. 26, pp. 147-160, Apr.1950.
  5. M. Y. Hsiao, "A class of optimal minimum oddweight- column SEC-DED codes," Research and Development, IBM Journal of, vol. 14, Issue 4, pp. 395-401, Jul. 1970. https://doi.org/10.1147/rd.144.0395
  6. Eiji Fujiwara, "Code design for dependable systems - Theory and practical applications," Wiley-interscience, 2006.
  7. S. Cha, Y. Lee, and H. Yoon, "A low-power ECC check bit generator implementation in DRAMs," Journal of Semiconductor Technology and Science, vol. 6, no. 4, pp. 252-256, Dec. 2006.
  8. P. K. Lala, P. Thenappan, and M. T. Anwar, "Single error correcting and double error detecting coding scheme," IET Electronics Letters, vol. 41, Issue 13, pp. 758-760, Feb. 2005. https://doi.org/10.1049/el:20050614
  9. S. Cha and H. Yoon, "High speed, minimal area, and low power SEC code for DRAMs with large I/O data widths," Circuits and Systems, 2007. ISCAS 2007. IEEE International Symposium on, pp. 3026-3029, May 2007.
  10. B. Polianskikh and Z. Zilic, "Design and implementation of error detection and correction circuitry for multilevel memory protection," Multiple-Valued Logic, 2002. ISMVL 2002. Proceedings 32nd IEEE International Symposium on, pp. 89-95, 2002.
  11. W. Gao and S. Simmons, "A study on the VLSI implementation of ECC for embedded DRAM," Electrical and Computer Engineering, 2003. IEEE CCECE 2003. Canadian Conference on, vol. 1, pp. 203-206, 2003.
  12. M. Nicolaidis, T. Bonnoit, and N.-E. Zergainoh, "Eliminating speed penalty in ECC protected memories," Design, Automation & Test in Europe Conference & Exhibition (DATE), pp. 1-6, 2011.

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  2. Compact and power efficient SEC-DED codec for computer memory pp.1432-1858, 2019, https://doi.org/10.1007/s00542-019-04366-7