Journal of the Korea Institute of Information and Communication Engineering (한국정보통신학회논문지)

The Korea Institute of Information and Commucation Engineering (한국정보통신학회)
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COF Defect Detection and Classification System Based on Reference Image

참조영상 기반의 COF 결함 검출 및 분류 시스템

  • Kim, Jin-Soo (Department of Information and Communication Engineering, Hanbat National University)
  • Received : 2013.05.27
  • Accepted : 2013.06.24
  • Published : 2013.08.31
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Abstract

This paper presents an efficient defect detection and classification system based on reference image for COF (Chip-on-Film) which encounters fatal defects after ultra fine pattern fabrication. These defects include typical ones such as open, mouse bite (near open), hard short and soft short. In order to detect these defects, conventionally it needs visual examination or electric circuits. However, these methods requires huge amount of time and money. In this paper, based on reference image, the proposed system detects fatal defect and efficiently classifies it to one of 4 types. The proposed system includes the preprocessing of the test image, the extraction of ROI, the analysis of local binary pattern and classification. Through simulations with lots of sample images, it is shown that the proposed system is very efficient in reducing huge amount of time and money for detecting the defects of ultra fine pattern COF.

본 논문에서는 초미세 패턴으로 구성된 칩-온-필름(Chip-on-Film, COF) 패키징 작업에서 발생하는 결함들을 참조영상에 기초하여 효율적으로 검출하고 분류하는 시스템을 제안한다. COF패키징 제작 과정에서 발생하는 치명적인 결함은 개방(open), 일부개방(mouse bite, near open), 단락(hard short) 및 돌기(protrusion, near short, soft short) 등을 포함한다. 이러한 결함을 검출하기 위해서는 기존에 직접 육안으로 식별하거나 또는 전기회로 설계를 이용하는 방법을 사용하였다. 그러나 이러한 방법은 매우 많은 시간과 고비용이 요구되는 단점이 있다. 본 논문에서는 참조영상을 사용하여 효과적으로 결함유무를 판단하고 결함이 발생되는 경우에 결함의 종류를 4 가지 형태로 분류하는 시스템을 제안한다. 제안방식은 검사영상의 전처리, 관심영역 추출, 지역이진분석에 의한 이물 특징 분석과 분류 등을 포함한다. 수많은 실험을 통해, 제안된 시스템은 초미세 패턴을 가진 COF의 결함 검사 및 분류에 대해 기존의 방식에 비해 시간과 경비를 줄이는데 효과적임을 보인다.

Keywords

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