References
- S.C. Johnson, "Flip-Chip Packaging Becomes Competitive," Semiconductor Int., May 2009.
- C.P. Wang, Materials for Advanced Packaging, Springer Science Business Media LLC, 2009.
- K. Hikasa and H. Irie, "Advanced Solder Bumping Technology Through Super Solder," IEEE/CPMT Int Electron. Manufact. Technol. Symp., 1997, pp. 48-55.
- M. Gerber et al., "Next Generation Fine Pitch Cu Pillar Technology - Enabling Next Generation Silicon Nodes," Proc. Electron. Compon. Technol. Conf., 2001, pp.612-618.
- K.-S. Choi et al., "Novel Bumping Material for Solder-on-Pad Technology," ETRI J., vol. 33, no. 4, Aug. 2011, pp. 637-640. https://doi.org/10.4218/etrij.11.0210.0298
- K.-S. Choi et al., "Novel Maskless Bumping for 3D Integration," ETRI J., vol. 32, no. 2, Apr. 2010, pp. 342-344. https://doi.org/10.4218/etrij.10.0209.0396
- K.-J. Sung et al., "Novel Bumping and Underfill Technologies for 3D IC Integration," ETRI J., vol. 34, no. 5, Oct. 2012, pp. 706-712. https://doi.org/10.4218/etrij.12.0112.0104
- K.-S. Choi et al., "Novel Bumping Process for Solder on Pad Technology," ETRI J., vol. 35, no. 2, Apr. 2013, pp. 340-343. https://doi.org/10.4218/etrij.13.0212.0302
- R. Agarwal et al., "Cu/Sn Microbumps Interconnect for 3D TSV Chip Stacking" Proc. Electron. Compon. Technol. Conf., 2010, pp. 858-863.
- Y.-S. Eom et al., "Characterization of Polymer Matrix and Low Melting Point Solder for Anisotropic Conductive Film," Microelectron. Eng., vol. 85, no. 2, Feb. 2008, pp. 327-331. https://doi.org/10.1016/j.mee.2007.07.005
- Y.-S. Eom et al., "Electrical Interconnection with a Smart ACA Composed of Fluxing Polymer and Solder Powder," ETRI J., vol. 32, no. 3, June 2010, pp. 414-420. https://doi.org/10.4218/etrij.10.0109.0400
- Y.-S. Eom et al., "Characterization of a Hybrid Cu Paste as an Isotropic Conductive Adhesive," ETRI J., vol. 33, no. 6, Dec. 2011, pp. 864-870. https://doi.org/10.4218/etrij.11.0110.0520
- J.-W. Baek et al., "Chemo-Rheological Characteristic of a Self-Assembling Anisotropic Conductive Adhesive System Containing a Low-Melting Point Solder," Microelectron. Eng., vol. 87, no. 18, Oct. 2010, pp. 1968-1972. https://doi.org/10.1016/j.mee.2009.12.020
- K.-S. Jang et al., "Catalytic Behavior of Sn/Bi Metal Powder in Anhydride-Based Epoxy Curing," J. Nanosci. Nanotechnol., vol. 9, no. 12, 2009, pp. 7461-7466.
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