Korean Management Science Review (경영과학)

The Korean Operations Research and Management Science Society (한국경영과학회)
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Generalized Q Control Charts for Short Run Processes in the Presence of Lot to Lot Variability

Lot간 변동이 존재하는 Short Run 공정 적용을 위한 일반화된 Q 관리도

  • Lee, Hyun Cheol (Korea Aerospace University, Department of Business Administration)
  • 이현철 (한국항공대학교 경영학과)
  • Received : 2014.06.03
  • Accepted : 2014.08.11
  • Published : 2014.11.30
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Abstract

We derive a generalized statistic form of Q control chart, which is especially suitable for short run productions and start-up processes, for the detection of process mean shifts. The generalization means that the derived control chart statistic concurrently uses within lot variability and between lot variability to explain the process variability. The latter variability source is noticeably prevalent in lot type production processes including semiconductor wafer fabrications. We first obtain the generalized Q control chart statistic when both the process mean and process variance are unknown, which represents the case of implementing statistical process control charting for short run productions and start-up processes. Also, we provide the corresponding generalized Q control chart statistics for the rest of three cases of previous Q control chart statistics : (1) both the process mean and process variance are known (2) only the process mean is unknown and (3) only the process variance is unknown.

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References

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