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Accelerated Life Test Design of an Electromagnetic Shielding Door Hinge

전자파 차폐도어용 힌지의 가속 수명 시험법 설계

  • Kim, Do Sik (Reliability Assessment Center, Korea Institute of Machinery & Materials) ;
  • Cheong, Han Young (Reliability Assessment Center, Korea Institute of Machinery & Materials)
  • 김도식 (한국기계연구원 신뢰성평가센터) ;
  • 정한영 (한국기계연구원 신뢰성평가센터)
  • Received : 2017.02.28
  • Accepted : 2017.06.21
  • Published : 2017.09.01

Abstract

This paper presents a study on the accelerated life tests of parts that operate during the opening and closing of door frames, particularly door hinges. Hinge theoretical verification and validation of the test equipment in the present study and the different structures and fault mode, depending on the purpose of usage analysis, failure mode for one of the hinges of the switchgear components used for electromagnetic shielding facilities and on-site operating conditions. The accelerated life test was designed for the characteristic lifetime prediction of the components, by estimating the shape parameter and the acceleration factor.

본 논문에서는 일반적으로 문틀과 문짝을 연결하여 개폐시 작동하는 부품인 힌지의 가속수명시험법에 대한 연구이다. 힌지는 사용하는 용도에 따라 구조와 고장모드가 상이하며 본 연구에서는 전자파 차폐시설에 사용되는 개폐장치 구성품 중 하나인 힌지에 대해서 고장모드를 분석하고 현장작동조건에서의 이론적 검증과 시험장비에 대한 타당성을 분석하였다. 그리고 형상모수와 가속지수의 추정을 통한 특성수명 예측을 위한 가속수명시험법을 설계하였다.

Keywords

References

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