Current Optics and Photonics

Optical Society of Korea (한국광학회)
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Negative-refraction Effect for Both TE and TM Polarizations in Two-dimensional Annular Photonic Crystals

  • Wu, Hong (School of Science, Nanjing University of Posts and Telecommunications) ;
  • Li, Feng (IEK-5 Photovoltaik, Forschungszentrum Julich)
  • Received : 2017.11.15
  • Accepted : 2017.12.25
  • Published : 2018.02.25
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Abstract

We systematically investigated the negative-refraction effect for both TE and TM polarizations in annular photonic crystals. Since two polarization waves are excited in different bands, they result in different refractive angles, and so polarization beam splitters can be made of annular photonic crystals. It was found that, in comparison to normal square-lattice air-hole photonic crystals, annular photonic crystals have a much wider common frequency band between TE-1 and TM-2, which is quite beneficial to finding the overlap between the negative-refraction regions belonging to TE-1 and TM-2 respectively. Further analyses of equifrequency surfaces and the electric-field distribution of annular photonic crystals with different parameters have not only demonstrated how the filling factor of annular cells affects the formation of the common negative-refraction region between TE-1 and TM-2, but also revealed some ways to improve the performance of a polarization beam splitter based on the negative-refraction effect in an annular photonic crystal.

Keywords

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FIG. 1. Schematic diagram of the square-lattice APC.

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FIG. 2. The band structures of square-lattice air-hole PCs with different parameters. The blue and yellow strips correspond to the negative-refraction regions for TE and TM polarizations respectively.

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FIG. 3. The EFSs and electric-field distribution when a slit beam impinges upon the PC slab with angle of incidence θin = 10° for (a1, a2) TE and (b1, b2) TM. The radius of the air holes is 0.5a. RTE-1, RTM-2, and R TM-3 epresent the negativerefracted beams inside the PC slab respectively.

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FIG. 4. The band structures of square-lattice APCs with different values of r when R = 0.47a. The blue and yellow strips correspond to the single-beam negative-refraction regions for TE and TM polarizations respectively.

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FIG. 5. The single-beam NRR-TE and single-beam NRR-TM areas in APC systems with different values of r when R = 0.47a.

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FIG. 6. (a) The bandwidth of single-beam CNRR for an APC, for several values of R as r changes from 0 to 0.36a. (b) The single-beam NRR-TE and single-beam NRR-TM areas in APC systems with different values of r when R = 0.48a. (c) The band structure of an APC with R = 0.48a, r = 0.23a.

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FIG. 7. (a) The EFSs and electric-field distribution when a slit beam impinges upon the APC slab with angle of incidence θin = 20° for (b1) TE and (b2) TM. The parameters of the APC are R = 0.47a and r = 0.25a. RTE and RTM represent the negative-refracted beams inside the PC slab respectively.

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