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Remedial Junction of Proton Irradiated Single Walled Carbon Nanotubes using Heat Treatment For Solar Energy Harvesting

태양에너지 획득 양성자 조사 단일벽 탄소나노튜브의 열처리에 의한 교정결합

  • Kim, Tae Gyu (Department of Nanomechatronics Engineering, Pusan National University) ;
  • Park, Young Min (Department of Nano Fusion Technology, Pusan National University) ;
  • Kim, Young Bae (Outside Cooperation, Dongbang Culture University) ;
  • Kim, Dae Weon (Division of Intelligent Vehicles, Silla University)
  • 김태규 (부산대학교 나노메카트로닉스공학과) ;
  • 박영민 (부산대학교 나노융합기술학과) ;
  • 김영배 (동방문화대학원대학교 대외협력단) ;
  • 김대원 (신라대학교 지능형자동차공학부)
  • Received : 2019.01.14
  • Accepted : 2019.01.28
  • Published : 2019.01.31

Abstract

The remedial junction is found in the network of single walled carbon nanotubes after the irradiation of protons not only for the better mechanical strength but also for the higher property of electrical conductivity. The irradiated proton formed a beam transferred sufficient energy to change the sp2 structure of atomic carbon as much as damage of crystalline formation, however it is shown the cross bonding while recovery of structure. This improved network in 2-D atomic chain of carbon is expected to use in a critical part in space energy harvesting system related with the solar radiation.

Keywords

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Fig. 1. MC-50 cyclotron in KIRAMS.

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Fig. 2. CNT network before proton irradiation (a) on scale 20 μm, (b) 50 nm, and (c) 10 nm where shown the overlapped Cross junction, not damaged and associated for connection.

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Fig. 3. CNT after irradiation with 3.4 MeV protons (a) shown damaged alike rupture with 1016 p/cm2 fluence, (b) typical remedial junction could find on 1014 p/cm2 fluence.

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Fig. 4. Change rate of sheet resistance in CNT after irradiation uaing 3.4 MeV protons with fluence of 1013 p cm2 fluence, 1014 p/cm2, 1015 p/cm2, and 1016 p/cm2.

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Fig. 5. Change of sheet resistance associated with the fluence of proton irradiation. In cases of 1013 p/cm2 and 1014 p/cm2 shown the reduction of resistance or induced defects for new allocated remedial junctions, that is the increase of electrical and thermal conductivity. the other hand, while done over fluence of 1015 p/cm2 fluence, the network of CNTs are changed to the aggravation of junction, that is the induction of serious defects.

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Fig. 6. Change of D/G ratio chcked with Raman Spectroscopy shown why have to use 3.4 MeV. Energy of 10 MeV damaged larger than those of 3.4 MeV.

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