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Improved photoresponsivity of AlGaN UV photodiode using antireflective nanostructure

반사방지 나노 구조체를 이용한 AlGaN UV 광다이오드의 광반응도 향상

  • Dac, Duc Chu (School of Electronic and Electrical Engineering, Hong-Ik University) ;
  • Choi, June-Heang (School of Electronic and Electrical Engineering, Hong-Ik University) ;
  • Kim, Jeong-Jin (Metamaterial Electronic Device Research Center, Hong-Ik University) ;
  • Cha, Ho-Young (School of Electronic and Electrical Engineering, Hong-Ik University)
  • Received : 2020.08.27
  • Accepted : 2020.09.22
  • Published : 2020.10.31

Abstract

In this study, we proposed an anti-reflective nano-structure to improve the photoresponsivity of AlGaN UV photodiode that can be used as a receiver in a solar blind UV optical communication system. The anti-reflective nano-structure was fabricated by forming Ni nano-clusters on SiO2 film followed by etching the underneath SiO2 film. A sample with the anti-reflective nano-structure exhibited lower surface reflection along with less dependency on the wavelength in comparison with a sample without the nano-structure. Finally, a UV photodiode was fabricated by applying an anti-reflective structure produced by heat-treating a 2 nm-thick Ni layer. The photodiode fabricated with the proposed nano-structure exhibited noticeable improvement in the photoresponsivity at the wavelength range from 240 nm to 270 nm in comparison with the same photodiode with a SiO2 film without the nano-structure.

본 연구에서는 Ni cluster를 이용하여 제작된 나노 구조체를 반사방지막으로 활용하여 비가시광 UV 광통신용 신호 수신단에 적용 가능한 AlGaN 광다이오드의 성능을 개선하는 구조를 제안하였다. 반사방지막의 제작은 SiO2 위에 Ni cluster를 형성한 후 SiO2를 부분적으로 식각하는 방식으로 제조하였다. 반사방지막이 적용된 샘플은 반사방지막이 없는 구조의 샘플에 비해 상대적으로 작아진 반사도를 보였으며 나노구조체가 없는 SiO2 가 증착된 구조에 비해서 입사 광파장의 변화에 대해 균일한 반사도를 보였다. 최종적으로 2 nm 두께의 Ni 층을 열처리하여 제작된 Ni cluster를 이용한 반사방지막을 적용하여 UV 광다이오드를 제작하였고, 그 결과 SiO2 단일막을 가진 센서에 비해 240 nm에서 270 nm 파장영역에서 개선된 광반응도를 보였다.

Keywords

References

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