References
- Victor H. Vartanian, Richard A. Allen, Larry Smith, Klaus Hummler, Steve Olson, and Brian C. Sapp, "Metrology needs for through-silicon via fabrication", Journal of Micro/Nanolithography, MEMS, and MOEMS 13(1), 011206 (27 February 2014). https://doi.org/10.1117/1.JMM.13.1.011206
- Arun A. Aiyer, Tianheng Wang, and Helen Simson, "Optical inspection technologies for 3D packaging", https://www.researchgate.net/publication/283489453_Optical_Inspection_Technologies_for_3D_Packaging, 2015.
- Kaiming He, Xiangyu Zhang, Shaoqing Ren, and Jian Sun, "Deep Residual Learning for Image Recognition", arXiv:1512.03385v1 [cs.CV], 2015.
- T.J Atherton, D.J. Kerbyson, "Size invariant circle detection", Image and Vision Computing. Volume 17, Number 11, 1999, pp. 795-803. https://doi.org/10.1016/S0262-8856(98)00160-7
- Ashardi Abas, Xun Chen, "COIL CHAMFER DIAMETER MEASUREMENT IN HELICAL SPRING BASED ON A HUGH TRANSFORM ALGORITHM", 4th International Conference on Artificial Intelligence and Computer Science, November 2016.
- Ali Ajdari Rad, Karim Faez, and Navid Qaragozlou, "Fast Circle Detection Using Gradient Pair Vectors", Proc. VIIth Digital Image Computing: Techniques and Applications, Sun C., Talbot H., Ourselin S. and Adriaansen T. (Eds.), 10-12 Dec. 2003, Sydney.
- J. P. Lewis, "Fast Template Matching", Vision Interface, pp. 120-123, 1995.
- Dirk-Jan Kroon, "Numerical Optimization of Kernel Based Image Derivatives", Short Paper, University of Twente, 2009.
- Sung Joo Kim, Kim Gyung Bum, "A Study on the Classification of Surface Defect Based on Deep Convolution Network and Transfer-learning", Journal of the Semiconductor & Display Technology, Vol. 20, No. 1, March 2021.
- Sung-jin Hwang, Seok-woo Hong, Jong-seo Yoon, Heemin Park, Hyun-chul Kim, "Deep Learning-based Pothole Detection System", Journal of the Semiconductor & Display Technology, Vol. 20, No. 1, March 2021.
- Song-Yeon Lee, Yong Jeong Huh, "A Study on Shape Warpage Defect Detecion Model of Scaffold Using Deep Learning Based CNN", Journal of the Semiconductor & Display Technology, Vol. 20, No. 1, March 2021.
- Diederik P. Kingma, Jimmy Ba, "Adam: A Method for Stochastic Optimization", Proceedings of the 3rd International Conference on Learning Representations, 2015.