Study on the Structural Design of an Ultra-miniaturized Microcolumn with a Built-in Electrostatic Octupole Stigmator

정전형 8중극 비점수차 보정기가 내장된 극초소형 마이크로컬럼의 구조 설계 연구

  • Tae Sik Oh (Department of Display & Semiconductor Engineering, College of Engineering, Sunmoon University)
  • 오태식 (선문대학교 공과대학 디스플레이반도체공학과)
  • Received : 2023.08.03
  • Accepted : 2023.09.12
  • Published : 2023.09.30

Abstract

We designed a novel ultra-miniaturized microcolumn structure having an stigmator to significantly improve throughput per unit time, which is the biggest disadvantage of microcolumns. We adopted the structure of the stigmator in the form of an electrostatic octupole electrode, and used an electrostatic quadrupole deflector with a relatively simple structure considering the increase in wiring due to the introduction of the stigmator. We have dramatically reduced the effect of astigmatism that occurs when the electron beam probe is scanned to the periphery of the target by introducing the stigmator between the control electrode and the deflector. As our numerical analysis simulation results, the field of view obtained as a result of this study is about 46.3% improved compared to our previous study, and the electron beam probe size of less than 10 nm was achieved in the entire field of view.

Keywords

References

  1. Chang, T. H. P., Kern, D. P., and McCord, M. A., "Electron optical performance of a scanning tunneling microscope controlled field emission microlens system", J. Vac. Sci. Tehnol. B: Microelectronics Processing and Phenomena 7, pp.1855-1861, 1989. https://doi.org/10.1116/1.584680
  2. Muray, L. P., Staufer, U., Kern, D. P., and Chang, T. H. P., "Performance measurements of 1-keV electron-beam microcolumn", J. Vac. Sci. Tehnol. B, Vol.10, No.6, pp.2749-2753, 1992.
  3. Chang, T. H. P., Muray, L. P., Staufer, U., and Kern, D. P., "A scanning tunneling microscope based microcolumn satem", Jpn. J. Appl. Phys., Vol.31, No.12B, pp.4232-4240, 1992. https://doi.org/10.1143/JJAP.31.4232
  4. Kratschmer. E., Kim. H. S., Thomson. M. G. R., Lee, K. Y., Rishton, S. A., Yu, M. L., and Chang, T. H. P., "Sub40 nm resolution 1 keV scanning tunneling microscope fielde mission microcolumn", J. Vac. Sci. Tehnol. B, Vol.12, No.6, pp.3503-3507, 1994.
  5. Thomson, M. G. R., and Chang, T. H. P., "Lens and deflector design for microcolumns", J. Vac. Sci. Tehnol. B, Vol.13, No.6, pp.2445-2449, 1995. https://doi.org/10.1116/1.588018
  6. Kratschmer, E., Kim, H. S., Thomson, M. G. R., Kratschmer, E., Yu, M. L., Lee, K. Y., Rishton, S. A., and Chang, T. H. P., "An electron-beam microcolumn with improved resolution, beam current, and stability", J. Vac. Sci. Tehnol. B, Vol.13, No.6, pp.2498-2503, 1995.
  7. Chang, T. H. P., Thomson, M. G. R., Kratschmer, E., Kim, H. S., Yu, M. L., Lee, K. Y., Rishton, S. A., Zolgharnain, S., and Hussey, B. W., "Electron-beam microcolumns for lithography and related applications", J. Vac. Sci. Technol. B, Vol.14, No.6, pp.3774-3781, 1996. https://doi.org/10.1116/1.588666
  8. Kratschmer, E., Kim, H. S., Thomson, M. G. R., Lee, K. Y., Rishton, S. A., Yu, M. L., Hussey, B. W., and Chang, T.H.P., "Experimental evaluation of a 20×20 mm footprint microcolumn", J. Vac. Sci. Technol. B, Vol.14, No.6, pp.3792-3796, 1996. https://doi.org/10.1116/1.588669
  9. Stebler, C., Staufer, T., and de Rooij, N. F., "Microfabricated double layer octupoles for microcolumn applications", Microelectronic Engineering, Vol.46, pp.401-404, 1999. https://doi.org/10.1016/S0167-9317(99)00118-5
  10. Saini, R., Jandric, Z., Tsui, K., Udeshi, T., and de Rooij, N. F., "Manufacturable MEMS microcolumn", Microelectronic Engineering, Vol.78-79, pp.62-72, 2005. https://doi.org/10.1016/j.mee.2004.12.010
  11. Oh, T. S., Kim, D. W., Ahn, S-J., Kim, Y. C., Ahn, S. J., and Kim, H. S, "Optimization of electrostatic lens systems for low-energy scanning microcolumn applications", J. Vac. Sci. Technol. A, Vol.26, No.6, pp.1443-1449, 2008. https://doi.org/10.1116/1.2987949
  12. Silver, C. S., Spallas, J. P., and Muray, L. P.. "Variable probe current using a condenser lens in a miniature electron beam column", Proc. of SPIE, Vol.7378, pp.787810 (1-7), 2009.
  13. Oh, T. S., Jin, S. W., Choi, S. K., Kim, Y. C., Kim, D. W., Ahn, S-J, Lee, Y. B., and Kim, H. S, "Experimental Study on the Operation of a Keyhole-Shaped Lens in a Microcolumn", J. of the Optical Society of Korea, Vol.15, No.4, pp.368-372, 2011. https://doi.org/10.3807/JOSK.2011.15.4.368
  14. Oh, T. S., Kim, D. W., Ahn, S-J., Jang, W. K., and Kim, H. S., "Improvement of the Probe Current in a Microcolumn by Introducing a Subsidiary Electrode in a Source Lens", J. of the Korea physical Society, Vol.63, No.6, pp.1128-1133, 2013. https://doi.org/10.3938/jkps.63.1128
  15. Kim, Y. C., Ahn, S-J, Oh, T. S., Kim, D. W., Jang, W. K., and Kim, H. S., "Low energy microcolumn for large field view inspection", Ultramicroscope, Vol.111, pp.1645-1649, 2011. https://doi.org/10.1016/j.ultramic.2011.09.016
  16. Oh, T. S., Kim, D. W., Ahn, S-J., and Kim, H. S., "Improved design of 5 nm class electron optical microcolumn for manufacturing convenience and its characteristics", J. Vac. Sci. Technol. A, Vol.31, No.6, pp.061601 (1-6), 2013.
  17. Oh, T. S., Kim, H. S, Ahn, S-J., and Kim, D. W., "Design of an ultra-miniaturized electron optical microcolumn with sub-5 nm very high resolution", Ultramicroscope, Vol.136, pp.171-175, 2014. https://doi.org/10.1016/j.ultramic.2013.10.003
  18. Kim, H. S., Lee, Y. B., Choi, S. W., Kim, H. W., Kim, D. W., Ahn, S-J., Song, H., Park, B. C., and Lim,. S. J., "Development of arrayed microcolumns and field emitters", Jpn. J. Appl. Phys., Vol.56, pp.06GA02(1-8), 2017. https://doi.org/10.7567/JJAP.56.06GA02
  19. Kim, Y. C., Kim, H. S., Ahn, S-J., Oh, T. S., Ahn, S. J., and Kim, D. W. "Study on the Scan Field of Modified Octupole and Quadrupole Deflector in a Microcolumn", J. of the Korea Academia-Industrial cooperation Society, Vol.19, No.11, pp.1-7, 2018.
  20. Kim, H. W., Lee, Y. B., Kim, D. W., Ahn, S-J., Oh, T. S., Kim, H. S, and Kim, Y. C., "Variations of the field of view depending on the Si deflector shape in a microcolumn", J. Vac. Sci. Technol. B, Vol.36, No.6, pp.06J902(1-6), 2018. https://doi.org/10.1116/1.5048128
  21. Lee, H. W., Lee, Y. B., and Oh, T. S., "Study on an Electrostatic Deflector for Ultra-miniaturized microcolumn to Realize sub-10 nm Ultra-High Resolution and Wide Field of View", J. of The Korean Society of Semiconductor & Display Technology, Vol. 20, No. 4, pp. 29-37, 2021.