A Novel Framework for Optimal IC Design and Statistical Analysis

최적의 IC 설계와 통계적 분석을 위한 새로운 설계 환경

  • 이재훈 (삼성전자 메모리본부 CAE그룹) ;
  • 김경호 (삼성전자 메모리본부 CAE그룹) ;
  • 김영길 (삼성전자 메모리본부 CAE그룹) ;
  • 김경화 (삼성전자 메모리본부 CAE그룹)
  • Published : 1994.03.01

Abstract

A New environment SENSATION for circuit optimization and statistical analysis has been developed. It provides real time simulation and includes automatic algorithms to assist for reaching optimal solution. Furthermore, statistical analysis environment is presented which aids in Monte Carlo analysis. worst case corner analysis, and sensitivity analysis. These capabilities faciliate the characterization of the effects of several operating conditions and manufacture process paramenters on the design performances. We verify that the proposed methods can obtain the optimal solution of the objective function through several experimental results.

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