Korean Journal of Optics and Photonics (한국광학회지)

Optical Society of Korea (한국광학회)
권호 표지

Reflection of a gaussian beam from a planar dielectric interface

  • Lee, Yeon H. (Electronics Department, Sung Kyun Kwan Univ.)
  • Published : 1996.09.01
Download PDF
⟨ Previous Next ⟩

Abstract

When a Gaussian beam is incident to a planar dielectric interface at an angle other than Brewster angle or the critical angle of total reflection, we derive the six nonspecular effects of rotation, lateral shift, focal shift, Rayleigh length change, magnitude and phase changes in the complex amplitude of the reflected beam simultaneously by taking account of the boundary condition. In the derivation we assume a Gaussian beam of fundamental mode to emerge from the interface and then match at the interface the constant, linear, and quadratic variations of the amplitude and phase of the reflected beam with those of the incident beam multiplied by the reflection coefficient. Our calculation shows that the six nonspecular effects can result from a linear variation of the natural logarithm of the reflection coefficient at the interface.

Keywords

References

  1. Optics(2nd Ed.) M. V. Klein;T. Furtak
  2. Ann. Physik v.1 no.6 Ein neuer und fundamentaler Versuch zur Totalreflexion F. Goos;H. Hanchen
  3. SIAM J. Appl. Math. v.24 no.3 Reflection and transmission of beams at a dielectric interfaces J. W. Ra;H. L. Bertoni;L. B. Felsen
  4. J. Opt. Soc. Am. v.67 no.5 Directional change of beams undergoing partial reflection I. A. White;A. W. Snyder;C. Pask
  5. Opt. Soc. Am. v.67 no.1 An angular spectrum representation approach to the Goos-Hanchen shift M. McGuirk;C. K. Carniglia
  6. J. Opt. Soc. Am. v.67 no.1 Focal shift and ray model for total internal reflection C. K. Carniglia;K. R. Brownstein
  7. J. Opt. Soc. Am. v.A5 no.9 Nonspecular phenomena on Gaussian beam reflection at dielectric interfaces S. Zhang;C. Fan
  8. J. Opt. Soc. Am. A v.6 no.9 Modified reflectance and geometrical deformations of Gaussian beams reflected at a dielectric interface W. Nasalski
  9. J. Opt. Soc. Am v.A7 no.2 Improved analysis of nonspecular phenomena in beams reflected from stratified media F. Falco;T. Tamir
  10. J. Opt. Soc. Am. v.67 no.10 Longitudinal and transverse displacements of a bounded microwave beam at total internal reflection J. J. Cowan;B. Anicin
  11. Phys. Pev. Lett. v.68 no.7 Direct Measurement of the Optical Goos-Hanchen Effect in Lasers F. Bretenaker;A. Le Floch;L. D utriaux
  12. Phys. Rev. Lett. v.70 no.15 Quantitative investigation of the effect of resonant absorbers on the Goos-Hachen shift E. Pfleghaar;A. Marseille;A. Weis