Korean Journal of Materials Research (한국재료학회지)

Materials Research Society of Korea (한국재료학회)
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The Flexural Strengths of Silicon Substrates with Various Surface Morphologies for Silicon Solar Cells

결정질 실리콘 태양전지용 실리콘 기판의 표면 미세구조에 따른 곡강도 특성

  • Lee, Joon-Sung (Department of Materials Science and Engineering, Korea University) ;
  • Kwon, Soon-Woo (R&D Center, TS Corporation) ;
  • Park, Ha-Young (Department of Materials Science and Engineering, Korea University) ;
  • Kim, Young-Do (Department of Materials Science and Engineering, Korea University) ;
  • Kim, Hyeong-Jun (Korea Institute of Ceramic Engineering & Technology) ;
  • Lim, Hee-Jin (Department of Materials Science and Engineering, Korea University) ;
  • Yoon, Se-Wang (R&D Center, TS Corporation) ;
  • Kim, Dong-Hwan (Department of Materials Science and Engineering, Korea University)
  • 이준성 (고려대학교 신소재공학과) ;
  • 권순우 (대한제당주식회사 중앙연구소) ;
  • 박하영 (고려대학교 신소재공학과) ;
  • 김영도 (고려대학교 신소재공학과) ;
  • 김형준 (요업기술원 기능소재팀) ;
  • 임희진 (고려대학교 신소재공학과) ;
  • 윤세왕 (대한제당주식회사 중앙연구소) ;
  • 김동환 (고려대학교 신소재공학과)
  • Published : 2009.01.31
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Abstract

The influence of various surface morphologies on the mechanical strength of silicon substrates was investigated in this study. The yield for the solar cell industry is mainly related to the fracturing of silicon wafers during the manufacturing process. The flexural strengths of silicon substrates were influenced by the density of the pyramids as well as by the size and the rounded surface of the pyramids. To characterize and optimize the relevant texturing process in terms of mechanical stability and the fabrication yield, the mechanical properties of textured silicon substrates were investigated to optimize the size and morphology of random pyramids. Several types of silicon substrates were studied, including the planar type, a textured surface with large and small pyramids, and a textured surface with rounded pyramids. The surface morphology and a cross-section of the as-textured and fractured silicon substrates were investigated by scanning electron microscopy.

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References

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